H01J 2237/2447
Imaging plates
H01J2237/2447 (Imaging plates) appears on 26 US grants and 25 published applications in this corpus.
Search patents in H01J- Granted patents
- 26
- Published applications
- 25
- Assignees
- 22
- Inventors
- 89
- Latest grant
- 16 Aug 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 0 | 1 |
| 2004 | 1 | 2 |
| 2005 | 1 | 1 |
| 2006 | 1 | 4 |
| 2007 | 4 | 1 |
| 2008 | 2 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 2 |
| 2011 | 1 | 0 |
| 2012 | 0 | 1 |
| 2013 | 1 | 0 |
| 2014 | 1 | 2 |
| 2015 | 1 | 3 |
| 2016 | 2 | 2 |
| 2017 | 1 | 1 |
| 2018 | 1 | 1 |
| 2019 | 1 | 0 |
| 2020 | 0 | 1 |
| 2021 | 1 | 1 |
| 2022 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Method of manufacturing a charged particle detector16 Aug 2022US 11,417,498 B2FEI Company
- Imaging device, imaging method, and imaging system16 Feb 2021US 10,921,266 B2Nanjing University
- Apparatus for high-speed imaging sensor data transfer1 Oct 2019US 10,429,321 B2KLA-Tencor Corporation
- Low energy electron microscopy5 Jun 2018US 9,991,094 B2Hon Hai Precision Industry Co., Ltd.
- Multi-beam particle microscope and method for operating same3 Jan 2017US 9,536,702 B2Carl Zeiss Microscopy GmbH
- Method of manufacturing a charged particle detector21 Jan 2021US 2021/0020400 A1FEI Company
- Imaging device, imaging method, and imaging system2 Jan 2020US 2020/0003709 A1Nanjing University
- Apparatus for High-Speed Imaging Sensor Data Transfer1 Mar 2018US 2018/0059033 A1KLA-Tencor Corporation
- Low energy electron microscopy14 Dec 2017US 2017/0358422 A1Hon Hai Precision Industry Co., Ltd.
- Radiation Sensor, and its Application in a Charged-Particle Microscope25 Feb 2016US 2016/0056015 A1FEI Company
Most cited
By later US patents
- Pattern inspection apparatus and electron beam apparatus86US 5,430,292 AFujitsu Limited · 1995
- Pattern inspection apparatus and electron beam apparatus86US 5,557,105 AFujitsu Limited · 1996
- Compact, integrated electron beam imaging system63US 5,122,663 AInternational Business Machine Corporation · 1992
- Pattern inspection apparatus and electron beam apparatus40US 5,384,463 AFujisu Limited · 1995
- Multi-beam particle microscope and method for operating same40US 9,536,702 B2Carl Zeiss Microscopy GmbH · 2017