Multi-beam particle microscope and method for operating same
AssigneeCarl Zeiss Microscopy GmbH
InventorsUwe Lang, Christian Crueger, Nico Kaemmer, Christof Riedesel
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AssigneeCarl Zeiss Microscopy GmbH
InventorsUwe Lang, Christian Crueger, Nico Kaemmer, Christof Riedesel
Estimating the term…
A multi-beam particle microscope includes first particle optics in order to direct particle beams onto an object, a detector with detection regions, with a transducer being assigned to each detection region, and a data acquisition system, which has a control computer system, image recording computer systems and a screen. The image recording computer systems receive electrical signals from the transducers and generates a first file, which represents a high resolution image, and a second file, which represents a low resolution image. The control computer system maintains a data structure which represents an assignment of transducers to two-dimensional spatial vectors and depicts the images on the screen, wherein a reference point in each image is arranged on the screen in a coordinate system of the screen at a location which is defined by a sum of a leading vector, which is the same for all images, and the spatial vector.
A multi-beam particle microscope, comprising:
A method of operating a multi-beam particle microscope, a field of view of the multi-beam microscope being smaller than a region of interest of an object to be examined, the method comprising:
Dependencies are inferred from the claim text.