H01J 2237/228
Charged particle holography
H01J2237/228 (Charged particle holography) appears on 20 US grants and 13 published applications in this corpus.
Search patents in H01J- Granted patents
- 20
- Published applications
- 13
- Assignees
- 12
- Inventors
- 45
- Latest grant
- 19 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 2 |
| 2009 | 1 | 2 |
| 2010 | 1 | 0 |
| 2011 | 2 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 1 | 1 |
| 2018 | 3 | 2 |
| 2019 | 0 | 1 |
| 2020 | 1 | 2 |
| 2021 | 1 | 0 |
| 2022 | 1 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Correction of aberrations in in-line electron holography19 May 2026US 12,632,943 B2FEI Company
- Method and apparatus for carrying out a time-resolved interferometric measurement5 Apr 2022US 11,293,747 B2Technische Universitaet Berlin
- Holography reconstruction method and program1 Jun 2021US 11,024,482 B2Riken
- System and method for performing nano beam diffraction analysis19 May 2020US 10,658,154 B2International Business Machines Corporation
- Charged particle beam device20 Nov 2018US 10,134,564 B2Hitachi High-Technologies Corporation
- Correction of aberrations in in-line electron holography4 Dec 2025US 2025/0371687 A1FEI Company
- Method and apparatus for carrying out a time-resolved interferometric measurement2 Apr 2020US 2020/0103213 A1Technische Universitaet Berlin
- Holography reconstruction method and program2 Apr 2020US 2020/0105498 A1Riken
- System and Method for Performing Nano Beam Diffraction Analysis31 Jan 2019US 2019/0035599 A1International Business Machines Corporation
- System and Method for Performing Nano Beam Diffraction Analysis5 Jul 2018US 2018/0190470 A1International Business Machines Corporation
Most cited
By later US patents
- Method of three-dimensional atomic imaging29US 5,095,207 AUniversity of Wisconsin - Milwaukee · 1992
- Electron holography microscope26US 4,532,422 AHitachi, Ltd. · 1985
- Electron holography apparatus25US 4,935,625 AHitachi, Ltd. · 1990
- Electron optical measurement apparatus18US 5,192,867 AHitachi, Ltd. · 1993
- Scanning interference electron microscope15US 7,417,227 B2Hitachi High-Technologies Corporation · 2008