H01J 2237/226
Image reconstruction
H01J2237/226 (Image reconstruction) appears on 250 US grants and 260 published applications in this corpus.
Search patents in H01J- Granted patents
- 250
- Published applications
- 260
- Assignees
- 95
- Inventors
- 659
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 3 | 0 |
| 1997 | 0 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 1 |
| 2002 | 1 | 0 |
| 2003 | 4 | 2 |
| 2004 | 2 | 2 |
| 2005 | 3 | 3 |
| 2006 | 2 | 3 |
| 2007 | 2 | 4 |
| 2008 | 6 | 11 |
| 2009 | 3 | 5 |
| 2010 | 8 | 7 |
| 2011 | 6 | 7 |
| 2012 | 9 | 6 |
| 2013 | 7 | 13 |
| 2014 | 12 | 11 |
| 2015 | 12 | 14 |
| 2016 | 6 | 13 |
| 2017 | 17 | 16 |
| 2018 | 16 | 18 |
| 2019 | 18 | 17 |
| 2020 | 20 | 20 |
| 2021 | 14 | 15 |
| 2022 | 20 | 17 |
| 2023 | 11 | 22 |
| 2024 | 11 | 12 |
| 2025 | 15 | 12 |
| 2026 | 6 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Scanning electron microscope (SEM) measurement method and apparatus26 May 2026US 12,640,340 B2Samsung Electronics Co., Ltd.
- Correction of aberrations in in-line electron holography19 May 2026US 12,632,943 B2FEI Company
- Method and scanning transmission charged-particle microscope12 May 2026US 12,626,884 B2FEI Company
- Sparse sampling using a programmatically randomized signal modulating a carrier signal31 Mar 2026US 12,592,358 B1Synchrotron Research, Inc.
- Methods of cross-section imaging of an inspection volume in a wafer17 Feb 2026US 12,557,588 B2Carl Zeiss SMT GmbH
- Diversifying sem measurement scheme for improved accuracy6 Aug 2026US 2026/0227350 A1ASML Netherlands B. V.
- Charged particle beam device, image processing method, and image processing program30 Jul 2026US 2026/0221379 A1Hitachi High-Tech Corporation
- Augmenting sem imaging output2 Jul 2026US 2026/0188608 A1Applied Materials Israel Ltd.
- Off-plane imaging mode for a laser phase plate2 Jul 2026US 2026/0188611 A1FEI Company
- Distributive imaging allowing sample relaxation28 May 2026US 2026/0148926 A1FEI Company
Most cited
By later US patents
- Scanning electron microscope and method for production of semiconductor device by using the same90US 5,412,210 AHitachi, Ltd. · 1995
- Image-formation apparatus using charged particle beams under various focus conditions68US 6,538,249 B1Hitachi, Ltd. · 2003
- Method and system for tomographic projection correction52US 8,353,628 B1Xradia, Inc. · 2013
- Multi-beam particle microscope and method for operating same40US 9,536,702 B2Carl Zeiss Microscopy GmbH · 2017
- Electron microscope36US 5,866,905 AHitachi, Ltd. · 1999