Electron holography apparatus
AssigneeHitachi, Ltd.
InventorsShuji Hasegawa, Junji Endo, Nobuyuki Osakabe, Akira Tonomura
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Abstract
An electron holography apparatus includes an electron microscope which is provided with an electron source, a beam splitter for dividing an electron beam emitted from the electron source into first and second electron beams, and a phase controller for controllably changing a phase difference between the first and second electron beams, and further includes an image detector for detecting an electron interference fringe pattern which varies in accordance with the phase difference between the first and second electron beams, as a picture image, and an image data processor for determining the phase distribution of one of the first and second electron beams from detected image data.
Claims9
An electron holography apparatus comprising:
- an electron microscope provided with an electron source, a beam splitter for dividing an electron beam emitted from the electron source into first and second electron beams, and a phase controller for controllably changing a phase difference between the first and second electron beams;
- an image detector for detecting an electron interference fringe pattern as a picture image, the electron interference fringe pattern varying in accordance with the phase difference between the first and second electron beams;
- an image data processor for determining the phase distribution of one of the first and second electron beams from detected image data;
- wherein the phase controller includes electric-field generating means for controlling the velocity of at least one of the first and second electron beams, to control the phase difference between the first and second electron beams.
An electron holography apparatus comprising:
- an electron microscope provided with an electron source, a beam splitter for dividing an electron beam emitted from the electron source into first and second electron beams, and a phase controller for controllably changing a phase difference between the first and second electron beams;
- an image detector for detecting an electron interference fringe pattern as a picture image, the electron interference fringe pattern varying in accordance with the phase difference between the first and second electron beams;
- an image data processor for determining the phase distribution of one of the first and second electron beams from detected image data;
- wherein the phase controller includes a body serving as a phase shifter, in such a manner that at least one of the first and second electron beams passes through the body, to control the phase difference between the first and second electron beams.
An electron holography apparatus comprising:
- an electron source;
- a beam splitter for dividing an electron beam emitted from said electron source into first and second electron beams;
- a phase controller for stepwise changing a relative phase difference between the first and second electron beams into a plurality of values;
- an electron biprism for superposing the first and second electron beams on each other to form an electron interference fringe pattern;
- an image detector for detecting in a time series a plurality of electron interference fringe patterns, which are obtained in the time series according to said plurality of phase difference values, as respective image data;
- and
- an image data processor for determining a phase distribution of at least one of the first and second beams from the image data corresponding to the plurality of electron interference fringe patterns.
Dependencies are inferred from the claim text.