H01J 2237/2002
Controlling environment of sample
H01J2237/2002 (Controlling environment of sample) appears on 301 US grants and 359 published applications in this corpus.
Search patents in H01J- Granted patents
- 301
- Published applications
- 359
- Assignees
- 175
- Inventors
- 691
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 4 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 2 |
| 2003 | 3 | 1 |
| 2004 | 3 | 5 |
| 2005 | 1 | 4 |
| 2006 | 4 | 8 |
| 2007 | 8 | 14 |
| 2008 | 7 | 10 |
| 2009 | 8 | 9 |
| 2010 | 4 | 19 |
| 2011 | 7 | 15 |
| 2012 | 10 | 14 |
| 2013 | 8 | 13 |
| 2014 | 17 | 19 |
| 2015 | 15 | 33 |
| 2016 | 34 | 31 |
| 2017 | 26 | 34 |
| 2018 | 23 | 17 |
| 2019 | 22 | 17 |
| 2020 | 21 | 15 |
| 2021 | 15 | 16 |
| 2022 | 11 | 15 |
| 2023 | 5 | 20 |
| 2024 | 11 | 17 |
| 2025 | 10 | 7 |
| 2026 | 9 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Sample holder, electron microscope system and sample observation method18 Aug 2026US 12,712,146 B2Hitachi, Ltd.
- Sample holder and electron microscope26 May 2026US 12,640,336 B2Hitachi, Ltd.
- Tomographic atom probe with terahertz pulse generator5 May 2026US 12,620,551 B2Centre National De La Recherche Scientifique
- Transmission electron microscope in-situ chip and preparation method therefor28 Apr 2026US 12,614,694 B2Xiamen Chip-Nova Technology Co., Ltd.
- Workstation, preparation station and method for manipulating an electron microscopy grid assembly17 Mar 2026US 12,580,149 B2Max-Planck-Gesellschaft Zur FöRderung Der Wissenschaften E. V.
- Integration of vapor deposition process into plasma etch reactor8 Oct 2026US 2026/0311972 A1Lam Research Corporation
- Workstation, preparation station and method for manipulating an electron microscopy grid assembly3 Sep 2026US 2026/0260839 A1Max-Planck-Gesellschaft Zur FöRderung Der Wissenschaften E. V.
- Grid box for electron microscope sample carriers21 May 2026US 2026/0142119 A1FEI Company
- Functionalized sleeve for sample holder19 Mar 2026US 2026/0081100 A1FEI Company
- Liquid sample holder with electrostatic microscope and control method for observing microscopic samples20 Nov 2025US 2025/0357072 A1Tamkang University
Most cited
By later US patents
- Hermetic sample holder and method for performing microanalysis under controlled atmosphere environment102US 8,087,309 B2Sion Power Corporation · 2012
- Plasma processing apparatus, and electrode structure and table structure of processing apparatus64US 7,033,444 B1Tokyo Electron Limited · 2006
- Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former61US 6,855,929 B2Ebara Corporation · 2005
- Environmental scanning electron microscope43US 5,362,964 AElectroScan Corporation · 1994
- Environmental scanning electron microscope42US 5,412,211 AElectroScan Corporation · 1995