Circuits or methods to detect or delay wearout of nonvolatile eprom or

Official title: {Circuits or methods to detect or delay wearout of nonvolatile EPROM or EEPROM memory devices, e.g. by counting numbers of erase or reprogram cycles, by using multiple memory areas serially or cyclically}

G11C16/3495 (Circuits or methods to detect or delay wearout of nonvolatile eprom or) appears on 1,139 US grants and 1,150 published applications in this corpus.