G11C 16/349
Arrangements for evaluating degradation, retention or wearout
Official title: {Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles}
G11C16/349 (Arrangements for evaluating degradation, retention or wearout) appears on 2,794 US grants and 2,908 published applications in this corpus.
Search patents in G11C- Granted patents
- 2,794
- Published applications
- 2,908
- Assignees
- 384
- Inventors
- 3,475
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 3 | 0 |
| 1989 | 1 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 4 | 0 |
| 1993 | 6 | 0 |
| 1994 | 3 | 0 |
| 1995 | 4 | 0 |
| 1996 | 16 | 0 |
| 1997 | 7 | 0 |
| 1998 | 12 | 0 |
| 1999 | 15 | 0 |
| 2000 | 13 | 0 |
| 2001 | 15 | 6 |
| 2002 | 10 | 12 |
| 2003 | 14 | 16 |
| 2004 | 13 | 29 |
| 2005 | 22 | 35 |
| 2006 | 30 | 47 |
| 2007 | 35 | 49 |
| 2008 | 44 | 78 |
| 2009 | 37 | 74 |
| 2010 | 56 | 105 |
| 2011 | 87 | 94 |
| 2012 | 88 | 115 |
| 2013 | 117 | 125 |
| 2014 | 143 | 191 |
| 2015 | 186 | 146 |
| 2016 | 183 | 168 |
| 2017 | 174 | 155 |
| 2018 | 151 | 130 |
| 2019 | 165 | 180 |
| 2020 | 187 | 194 |
| 2021 | 207 | 185 |
| 2022 | 188 | 241 |
| 2023 | 218 | 174 |
| 2024 | 172 | 134 |
| 2025 | 100 | 117 |
| 2026 | 63 | 108 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Nonvolatile memory device and operating method based on program execution and/or erase execution time22 Sep 2026US 12,744,096 B2Samsung Electronics Co., Ltd.
- Lifetime mixed level non-volatile memory system8 Sep 2026US 12,731,638 B2Vervain, LLC
- Non-volatile memory system and data recover read operation method thereof8 Sep 2026US 12,731,653 B2Samsung Electronics Co., Ltd.
- Memory device, memory system, memory controller, and operation method1 Sep 2026US 12,725,668 B2Yangtze Memory Technologies Co., Ltd.
- Techniques for managing a voltage recovery operation1 Sep 2026US 12,725,669 B2Micron Technology, Inc.
- Selective use of a word line monitoring procedure for reliability-risk word lines8 Oct 2026US 2026/0311782 A1Micron Technology, Inc.
- Memory system8 Oct 2026US 2026/0311783 A1Kioxia Corporation
- Nand detect empty page scan1 Oct 2026US 2026/0301822 A1Micron Technology, Inc.
- Accelerating program-erase cycles on memory devices24 Sep 2026US 2026/0288604 A1Micron Technology, Inc.
- Self-heating nand for recovery at end of life17 Sep 2026US 2026/0279475 A1SanDisk Technologies LLC
Most cited
By later US patents
- Multi-state memory1,008US 6,222,762 B1SanDisk Corporation · 2001
- Highly compact EPROM and flash EEPROM devices819US 5,095,344 A1992
- Flash EEPROM memory systems having multistate storage cells579US 5,043,940 A1991
- Wear leveling techniques for flash EEPROM systems553US 6,230,233 B1SanDisk Corporation · 2001
- Method and apparatus for storing data in a NAND flash memory506US 8,437,189 B1Marvell International Ltd. · 2013