G06F 2119/18
Manufacturability analysis or optimisation for manufacturability
G06F2119/18 (Manufacturability analysis or optimisation for manufacturability) appears on 2,287 US grants and 2,924 published applications in this corpus.
Search patents in G06F- Granted patents
- 2,287
- Published applications
- 2,924
- Assignees
- 724
- Inventors
- 5,428
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 2 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 4 | 0 |
| 1998 | 3 | 0 |
| 1999 | 5 | 0 |
| 2000 | 3 | 0 |
| 2001 | 1 | 0 |
| 2002 | 3 | 1 |
| 2003 | 2 | 13 |
| 2004 | 5 | 18 |
| 2005 | 5 | 46 |
| 2006 | 25 | 36 |
| 2007 | 29 | 46 |
| 2008 | 33 | 59 |
| 2009 | 43 | 77 |
| 2010 | 68 | 99 |
| 2011 | 64 | 68 |
| 2012 | 84 | 66 |
| 2013 | 110 | 90 |
| 2014 | 145 | 121 |
| 2015 | 87 | 128 |
| 2016 | 99 | 95 |
| 2017 | 89 | 181 |
| 2018 | 121 | 181 |
| 2019 | 186 | 226 |
| 2020 | 185 | 211 |
| 2021 | 198 | 201 |
| 2022 | 151 | 199 |
| 2023 | 179 | 226 |
| 2024 | 119 | 175 |
| 2025 | 137 | 172 |
| 2026 | 101 | 189 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Mask optimization for layer accounting for overlap with other layers6 Oct 2026US 12,754,471 B2D2S, Inc.
- Mask optimization for layer based on comparison of components in layer to components in other layers6 Oct 2026US 12,754,472 B2D2S, Inc.
- Mask optimization preferentially accounting for overlap regions6 Oct 2026US 12,754,473 B2D2S, Inc.
- Concurrent mask optimization for multiple layers6 Oct 2026US 12,754,474 B2D2S, Inc.
- Machine learning based metrology for semiconductor specimens6 Oct 2026US 12,754,484 B2Applied Materials Israel Ltd.
- Method of controlling the biodegradability of magnesium and its alloys8 Oct 2026US 2026/0306225 A1Osseolabs Company Limited
- Methods of forming a composite structure and associated automated manufacturing systems and components8 Oct 2026US 2026/0307340 A1Northrop Grumman Systems Corporation
- Kernel function generation method, optical proximity correction method using the kernel function, and mask manufacturing method including the optical proximity correction method8 Oct 2026US 2026/0310064 A1Samsung Electronics Co., Ltd.
- Mask optimization accounting for more critical and less critical overlap regions8 Oct 2026US 2026/0310067 A1D2S, Inc.
- Rigid-flex circuit board1 Oct 2026US 2026/0300604 A1Dassault Systemes
Most cited
By later US patents
- Design rule checking system and method400US 6,470,489 B1Numerical Technologies, Inc. · 2002
- Dummy fill for integrated circuits274US 7,152,215 B2Praesagus, Inc. · 2006
- Method for planning layout for LSI pattern, method for forming LSI pattern and method for generating mask data for LSI231US 6,691,297 B1Matsushita Electric Industrial Co., Ltd. · 2004
- System for designing integrated circuits with enhanced manufacturability231US 7,523,429 B2Takumi Technology Corporation · 2009
- Use of models in integrated circuit fabrication222US 7,360,179 B2Cadence Design Systems, Inc. · 2008