G01R 31/318502
Test of combinational circuits
Official title: {Test of Combinational circuits}
G01R31/318502 (Test of combinational circuits) appears on 128 US grants and 95 published applications in this corpus.
Search patents in G01R- Granted patents
- 128
- Published applications
- 95
- Assignees
- 43
- Inventors
- 151
- Latest grant
- 27 May 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 9 | 7 |
| 2002 | 10 | 12 |
| 2003 | 8 | 7 |
| 2004 | 13 | 15 |
| 2005 | 11 | 7 |
| 2006 | 6 | 3 |
| 2007 | 8 | 5 |
| 2008 | 5 | 7 |
| 2009 | 4 | 8 |
| 2010 | 12 | 7 |
| 2011 | 6 | 3 |
| 2012 | 6 | 1 |
| 2013 | 3 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 1 |
| 2016 | 1 | 0 |
| 2017 | 0 | 0 |
| 2018 | 2 | 2 |
| 2019 | 1 | 0 |
| 2020 | 0 | 0 |
| 2021 | 3 | 4 |
| 2022 | 1 | 2 |
| 2023 | 3 | 1 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Automatic test pattern generation-based circuit verification method and apparatus27 May 2025US 12,313,680 B2Huawei Technologies Co., Ltd.
- Stimulated circuits and fault testing methods26 Dec 2023US 11,852,685 B2Hamilton Sundstrand Corporation
- Pseudo-random binary sequences (PRBS) generator for performing on-chip testing and a method thereof3 Oct 2023US 11,774,496 B2Indian Institute of Technology
- Method of high speed and dynamic configuration of a transceiver system4 Apr 2023US 11,621,770 B2Hughes Network Systems, LLC
- Test circuit6 Dec 2022US 11,519,962 B2Realtek Semiconductor Corp.
- Electronic device and operation method therefor23 Apr 2026US 2026/0110734 A1LG Electronics Inc.
- Automatic Test Pattern Generation-Based Circuit Verification Method and Apparatus18 Apr 2024US 2024/0125850 A1Huawei Technologies Co., Ltd.
- Stimulated circuits and fault testing methods13 Jul 2023US 2023/0221369 A1Hamilton Sundstrand Corporation
- Pseudo-random binary sequences (prbs) generator for performing on-chip testing and a method thereof6 Oct 2022US 2022/0317181 A1Indian Institute of Technology
- Test circuit8 Sep 2022US 2022/0283222 A1Realtek Semiconductor Corp.
Most cited
By later US patents
- Efficient fir filter for high-speed communication118US 6,272,173 B1Broadcom Corporation · 2001
- Pair-swap independent trellis decoder for a multi-pair gigabit transceiver95US 6,865,234 B1Broadcom Corporation · 2005
- Demodulator for a multi-pair gigabit transceiver83US 6,201,831 B1Broadcom Corporation · 2001
- Multi-pair gigabit ethernet transceiver having adaptive disabling of circuit elements71US 7,197,069 B2Broadcom Corporation · 2007
- System and method for high-speed decoding and ISI compensation in a multi-pair transceiver system68US 6,249,544 B1Broadcom Corporation · 2001