Stimulated circuits and fault testing methods

A method for fault insertion testing in a circuit, the method comprising:

• removing a zero-ohm resistor between a power supply input pin and a test input pin;
• inserting a low-ohm resistor in place of the zero-ohm resistor;
• connecting a test fixture to be in electrical communication with the low-ohm resistor and the test input pin on a test input pin side of the low-ohm resistor;
• and
• reverse driving voltage at the test input pin to change an output of a logic module.

A system configured for fault insertion testing, comprising:

• an input module configured to output an input signal;
• a logic gate system for fault insertion testing, comprising:
• a logic gate module having:
• a plurality of input pins, the plurality of input pins comprising:
• an input signal pin connected to the input module and configured to receive the input signal from the input module;
• a power supply input pin configured to receive power from a power supply;
• and
• a test input pin;
• and
• an output pin connected to the input pins via one or more logic gates;
• a power supply line connected to the power supply input pin and the test input pin;
• and
• a zero-ohm jumper resistor disposed between the power supply input pin and the test input pin, wherein the zero-ohm resistor is configured to be replaced with a low ohm resistor to allow reverse driving a voltage on the test input pin, wherein the one or more logic gates are configured to reverse an output at the output pin when the voltage on the test input pin is reverse driven;
• and
• a circuit-to-be-tested connected to the output pin to receive the output from the logic gate module.