G01Q 30/00
Auxiliary means serving to assist or improve the scanning probe techniques or
Official title: Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
G01Q30/00 (Auxiliary means serving to assist or improve the scanning probe techniques or) appears on 930 US grants and 825 published applications in this corpus.
Search patents in G01Q- Granted patents
- 930
- Published applications
- 825
- Assignees
- 439
- Inventors
- 1,831
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 5 | 0 |
| 1990 | 7 | 0 |
| 1991 | 11 | 0 |
| 1992 | 10 | 0 |
| 1993 | 12 | 0 |
| 1994 | 14 | 0 |
| 1995 | 16 | 0 |
| 1996 | 19 | 0 |
| 1997 | 11 | 0 |
| 1998 | 20 | 0 |
| 1999 | 21 | 0 |
| 2000 | 14 | 0 |
| 2001 | 25 | 10 |
| 2002 | 17 | 12 |
| 2003 | 13 | 10 |
| 2004 | 13 | 18 |
| 2005 | 13 | 27 |
| 2006 | 22 | 23 |
| 2007 | 18 | 30 |
| 2008 | 27 | 48 |
| 2009 | 29 | 24 |
| 2010 | 28 | 45 |
| 2011 | 27 | 33 |
| 2012 | 36 | 29 |
| 2013 | 41 | 36 |
| 2014 | 40 | 29 |
| 2015 | 46 | 60 |
| 2016 | 34 | 29 |
| 2017 | 34 | 39 |
| 2018 | 40 | 48 |
| 2019 | 27 | 49 |
| 2020 | 58 | 39 |
| 2021 | 32 | 43 |
| 2022 | 42 | 44 |
| 2023 | 48 | 31 |
| 2024 | 21 | 34 |
| 2025 | 24 | 23 |
| 2026 | 13 | 12 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01Q 30/04Display or data processing devices381
- G01Q 30/02Non-spm analysing devices369
- G01Q 30/08Means for establishing or regulating a desired environmental condition within a sample202
- G01Q 30/20Sample handling devices or methods81
- G01Q 30/18Means for protecting or isolating the interior of a sample chamber from34
Recent patents
- Decoupled optical force nanoscopy6 Oct 2026US 12,754,207 B2The Board of Trustees of the University of Illinois
- Method of removing defect of mask15 Sep 2026US 12,736,870 B2Samsung Electronics Co., Ltd.
- Atomic force microscope (AFM) device and method of operating the same8 Sep 2026US 12,730,127 B2Nearfield Instruments B.V.
- Grid plate encoder based positioning system and method1 Sep 2026US 12,724,038 B2Nearfield Instruments B.V.
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- Method of and system for processing threedimensional measurement data from a scanning probe microscopy system, as well as computer program product8 Oct 2026US 2026/0309744 A1Nearfield Instruments B.V.
- Holding Device and Method for Probe Microscopy and Optical Methods8 Oct 2026US 2026/0309745 A1Bruker Nano, Inc.
- Method for measuring cellular mechanics in an in vitro fibrosis model24 Sep 2026US 2026/0287509 A1National Cheng Kung University
- Machine-Learning Based Methods of Probe Microscopy10 Sep 2026US 2026/0266868 A1Infinitesima Limited
- Method of Dispositioning and Control of a Semiconductor Manufacturing Process10 Sep 2026US 2026/0269176 A1Fractilia, LLC
Most cited
By later US patents
- Scanning tunneling microscope200US 4,343,993 AInternational Business Machines Corporation · 1982
- Scanning probe microscope143US 5,376,790 APark Scientific Instruments · 1994
- Large stage system for scanning probe microscopes and other instruments125US 5,672,816 APark Scientific Instruments · 1997
- Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images114US 6,232,597 B1General Nanotechnology LLC · 2001
- Edge detector101US 5,304,924 ACanon Kabushiki Kaisha · 1994