Holding Device and Method for Probe Microscopy and Optical Methods
AssigneeBruker Nano, Inc.
InventorsTorsten Müller, André Körnig, Jonas Hiller, Detlef Knebel
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Abstract
The invention relates to a holding device and a method for probe microscopy and optical methods. The holding device has the following: an at least partially transparently formed first layer for receiving a sample which can be examined by means of a probe microscope probe guided from above, and a second layer below the first layer for stabilizing the first layer, wherein the second layer has an opening for optical methods which is formed with at least two partial openings which are separated from one another by at least one bridge.
Claims12
A holding device for probe microscopy and optical methods, comprising:
- an at least partially transparently formed first layer for receiving a sample which can be examined by means of a probe microscope probe guided from above, and
- a second layer below the first layer for stabilizing the first layer, wherein the second layer has an opening for optical methods which is formed with at least two partial openings which are separated from one another by at least one bridge.
A method for probe microscopy and optical methods, comprising:
- providing an at least partially transparently formed first layer and a sample on the first layer,
- providing a second layer below the first layer for stabilizing the first layer, wherein the second layer has an opening which is formed with at least two partial openings which are separated from one another by at least one bridge, and
- at least one of examining and manipulating the sample by means of a probe microscope probe guided from above and by means of an optical device through the opening.
Dependencies are inferred from the claim text.