G01Q 30/04
Display or data processing devices
G01Q30/04 (Display or data processing devices) appears on 381 US grants and 374 published applications in this corpus.
Search patents in G01Q- Granted patents
- 381
- Published applications
- 374
- Assignees
- 201
- Inventors
- 823
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 2 | 0 |
| 1990 | 0 | 0 |
| 1991 | 4 | 0 |
| 1992 | 5 | 0 |
| 1993 | 3 | 0 |
| 1994 | 3 | 0 |
| 1995 | 5 | 0 |
| 1996 | 5 | 0 |
| 1997 | 0 | 0 |
| 1998 | 3 | 0 |
| 1999 | 4 | 0 |
| 2000 | 4 | 0 |
| 2001 | 8 | 5 |
| 2002 | 6 | 4 |
| 2003 | 2 | 1 |
| 2004 | 5 | 10 |
| 2005 | 9 | 15 |
| 2006 | 10 | 9 |
| 2007 | 10 | 20 |
| 2008 | 16 | 27 |
| 2009 | 15 | 15 |
| 2010 | 16 | 21 |
| 2011 | 12 | 11 |
| 2012 | 20 | 8 |
| 2013 | 12 | 13 |
| 2014 | 10 | 6 |
| 2015 | 15 | 22 |
| 2016 | 13 | 14 |
| 2017 | 16 | 11 |
| 2018 | 18 | 16 |
| 2019 | 9 | 18 |
| 2020 | 19 | 20 |
| 2021 | 13 | 28 |
| 2022 | 27 | 22 |
| 2023 | 26 | 22 |
| 2024 | 14 | 20 |
| 2025 | 13 | 11 |
| 2026 | 9 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Decoupled optical force nanoscopy6 Oct 2026US 12,754,207 B2The Board of Trustees of the University of Illinois
- Method of removing defect of mask15 Sep 2026US 12,736,870 B2Samsung Electronics Co., Ltd.
- Atomic force microscope (AFM) device and method of operating the same8 Sep 2026US 12,730,127 B2Nearfield Instruments B.V.
- Grid plate encoder based positioning system and method1 Sep 2026US 12,724,038 B2Nearfield Instruments B.V.
- System and method for generating and analyzing roughness measurements and their use for process monitoring and control23 Jun 2026US 12,665,160 B2Fractilia, LLC
- Method of and system for processing threedimensional measurement data from a scanning probe microscopy system, as well as computer program product8 Oct 2026US 2026/0309744 A1Nearfield Instruments B.V.
- Machine-Learning Based Methods of Probe Microscopy10 Sep 2026US 2026/0266868 A1Infinitesima Limited
- Method of Dispositioning and Control of a Semiconductor Manufacturing Process10 Sep 2026US 2026/0269176 A1Fractilia, LLC
- Method of Dispositioning and Control of a Semiconductor Manufacturing Process27 Aug 2026US 2026/0253833 A1Fractilia, LLC
- Apparatus and method for identifying target position in atomic force microscope22 Jan 2026US 2026/0023095 A1Park Systems Corp.
Most cited
By later US patents
- Scanning probe microscope having scan correction90US 5,210,410 AThe Board of Trustees of the Leland Stanford Junior University · 1993
- Object inspection and/or modification system and method89US 6,337,479 B12002
- Scanning probe microscope having automatic probe exchange and alignment86US 5,705,814 ADigital Instruments, Inc. · 1998
- Scanning probe microscope with scan correction75US 6,265,718 B1ThermoMicroscopes Corporation · 2001
- System for locating a feature of a surface57US 5,866,806 AKLA-Tencor Corporation · 1999