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US 6,265,718 B1Granted
Scanning probe microscope with scan correction
AssigneeThermoMicroscopes Corporation
InventorsSang-Il Park, Ian R. Smith
Life of this patent
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Abstract
An optical system for a scanning probe microscope provides both an optical on-axis view and an optical oblique view of the sample by means of two optical paths each providing an image to a CCD camera via an auto-zoom lens. A shutter alternately blocks the image of either view from reaching the auto-zoom lens. The CCD camera provides the optical image to a video display which also displays the scanning probe image, thus eliminating the need for eyepieces and allowing easy viewing of both the optical and scanning probe images simultaneously.
Claims4
A method for operating a scanning microscope comprising:
- scanning a probe relative to a sample;
- generating an error signal based on a sensed x, y spatial relationship between the probe and the sample;
- and
- varying a manner in which the probe is scanned relative to the sample in response to the error signal, wherein varying the manner includes at least one scan parameter selected from the group consisting of dynamic range, feedback filter parameters, tip contact force, tunneling voltage and tunneling current.
1 more element
Dependencies are inferred from the claim text.