G01N 23/2204
Specimen supports therefor
Official title: Specimen supports therefor; Sample conveying means therefore
G01N23/2204 (Specimen supports therefor) appears on 168 US grants and 187 published applications in this corpus.
Search patents in G01N- Granted patents
- 168
- Published applications
- 187
- Assignees
- 128
- Inventors
- 488
- Latest grant
- 14 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 4 | 0 |
| 1978 | 0 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 3 | 0 |
| 1986 | 2 | 0 |
| 1987 | 3 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 3 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 3 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 1 |
| 2003 | 1 | 0 |
| 2004 | 1 | 0 |
| 2005 | 0 | 2 |
| 2006 | 4 | 4 |
| 2007 | 0 | 1 |
| 2008 | 2 | 1 |
| 2009 | 1 | 10 |
| 2010 | 3 | 2 |
| 2011 | 4 | 2 |
| 2012 | 2 | 4 |
| 2013 | 2 | 5 |
| 2014 | 3 | 8 |
| 2015 | 8 | 12 |
| 2016 | 7 | 4 |
| 2017 | 12 | 22 |
| 2018 | 3 | 8 |
| 2019 | 17 | 15 |
| 2020 | 14 | 6 |
| 2021 | 8 | 16 |
| 2022 | 10 | 8 |
| 2023 | 6 | 19 |
| 2024 | 10 | 11 |
| 2025 | 14 | 12 |
| 2026 | 7 | 14 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Analysis system, analysis device, and control method14 Jul 2026US 12,680,971 B2Shimadzu Corporation
- Determining a position of an object in a beam apparatus16 Jun 2026US 12,658,406 B2Carl Zeiss Microscopy GmbH
- Transmission electron microscope in-situ chip and preparation method therefor28 Apr 2026US 12,614,694 B2Xiamen Chip-Nova Technology Co., Ltd.
- Sample holder21 Apr 2026US 12,607,580 B1Rigaku Corporation
- Automated analyzer7 Apr 2026US 12,596,083 B2Shimadzu Corporation
- Sample preparation system for electron microscopy8 Oct 2026US 2026/0309653 A1The Regents of the University of California
- Foreign substance capture kit for collecting foreign substances in electrode active material27 Aug 2026US 2026/0249214 A1LG Energy Solution, Ltd.
- Analyzer and Analysis Method27 Aug 2026US 2026/0251596 A1JEOL Ltd.
- Transfer Module and Transfer Method for a Sample Material16 Jul 2026US 2026/0202362 A1Kammrath & Weiss GMBH
- X-ray fluorescence spectrometer21 May 2026US 2026/0140075 A1Rigaku Corporation
Most cited
By later US patents
- Thin film sample support80US 5,958,345 AMoxtek, Inc. · 1999
- Testing apparatus using charged particles and device manufacturing method using the testing apparatus76US 7,138,629 B2Ebara Corporation · 2006
- Material measurement techniques using multiple X-ray micro-beams37US 10,247,683 B2Sigray, Inc. · 2019
- Carrier for holding analytical samples29US 4,562,045 AMurata Manufacturing Co., Ltd. · 1985
- X-ray thin film inspection device27US 10,473,598 B2Rigaku Corporation · 2019