X-ray fluorescence spectrometer
AssigneeRigaku Corporation
InventorsYoshiaki TANAKA, Koichi AOYAGI
Life of this patent
Estimating the term…
Loading patent…
AssigneeRigaku Corporation
InventorsYoshiaki TANAKA, Koichi AOYAGI
Estimating the term…
Measurement can be performed even when spaces divided by a partition film have a pressure difference therebetween, and the partition film is easily extended without causing warping and wrinkles. Provided is an X-ray fluorescence spectrometer, which includes: an irradiation chamber; and a sample chamber, the X-ray fluorescence spectrometer including: a window frame holding member; and a window frame member, which is configured to hold a partition film. The window frame member includes: an inner film holding member including a peripheral wall extending from a proximal end; and an outer film holding member, the outer film holding member being configured to be inserted from the distal end of the inner film holding member to be mounted to the proximal end of the inner film holding member so as to fix a surrounding of the part of the partition film to the inner film holding member.
An X-ray fluorescence spectrometer, which includes:
Dependencies are inferred from the claim text.