Sample preparation system for electron microscopy

A system comprising:

• a first sample holder tray operable to hold scanning electron microscopy (SEM) stubs;
• a second sample holder tray operable to hold transmission electron microscopy (TEM) grids;
• a sample holder handling apparatus including:
• a vacuum pump;
• a SEM needle, the SEM needle comprising a first hollow cylinder operable to hold a SEM stub when a vacuum is applied to the first hollow cylinder with the vacuum pump;
• and
• a TEM needle, the TEM needle comprising a second hollow cylinder operable to hold a TEM grid when a vacuum is applied to the second hollow cylinder with the vacuum pump;
• and
• a sample exposing apparatus, the sample exposing apparatus including:
• a platform comprising a flat surface;
• an electrode;
• and
• a high voltage power supply, the high voltage power supply operable to apply a voltage to the electrode and the SEM stub or the electrode and a second electrode positioned proximate the TEM grid, the voltage operable to attract a powder sample disposed on the platform to the SEM stub or the TEM grid;
• the sample holder handling apparatus operable to transfer the SEM stub or the TEM grid to the first sample holder tray or the second sample holder tray, respectively, and the sample exposing apparatus.