G01N 2223/6113
Printed circuit board [pcb]
Official title: printed circuit board [PCB]
G01N2223/6113 (Printed circuit board [pcb]) appears on 55 US grants and 66 published applications in this corpus.
Search patents in G01N- Granted patents
- 55
- Published applications
- 66
- Assignees
- 50
- Inventors
- 182
- Latest grant
- 19 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 2 | 0 |
| 2007 | 0 | 0 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 1 | 3 |
| 2012 | 1 | 0 |
| 2013 | 4 | 3 |
| 2014 | 0 | 4 |
| 2015 | 2 | 7 |
| 2016 | 6 | 4 |
| 2017 | 3 | 6 |
| 2018 | 4 | 3 |
| 2019 | 6 | 3 |
| 2020 | 2 | 4 |
| 2021 | 7 | 6 |
| 2022 | 1 | 3 |
| 2023 | 4 | 9 |
| 2024 | 1 | 2 |
| 2025 | 6 | 5 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for analyzing quality of thin surface layer of PCB19 May 2026US 12,631,580 B2Guangzhou Termbray Electronics Tech Co., Ltd.
- System and method for image segmentation from sparse particle impingement data17 Feb 2026US 12,555,241 B2Techinsights Inc.
- Inspection device5 Aug 2025US 12,379,334 B2Saki Corporation
- X-ray radioscope15 Jul 2025US 12,360,061 B2BEAMSENSE Co., Ltd.
- Method of failure analysis for defect locations24 Jun 2025US 12,339,202 B2Shanghai Huali Integrated Circuit Corporation
- X-ray imaging system16 Jul 2026US 2026/0204508 A1
- Solder material with contrast agent1 Jan 2026US 2026/0002890 A1
- System and method for xrf inspection4 Dec 2025US 2025/0369905 A1Rigaku Semiconductor Instruments Ltd.
- Measuring method and measuring device31 Jul 2025US 2025/0244266 A1Japan Display Inc.
- X-ray inspection system for inspection of an object8 May 2025US 2025/0146958 A1
Most cited
By later US patents
- High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source67US 7,130,375 B1Xradia, Inc. · 2006
- High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source52US 7,400,704 B1Xradia, Inc. · 2008
- X-ray inspection apparatus and X-ray inspection method27US 7,099,432 B2Matsushita Electric Industrial Co., Ltd. · 2006
- X-ray inspection device22US 9,322,790 B2Yamaha Hatsudoki Kabushiki Kaisha · 2016
- Complex inspection device for printed-substrate22US 9,329,139 B2Yamaha Hatsudoki Kabushiki Kaisha · 2016