H01J 37/224
Luminescent screens or photographic plates for imaging
Official title: {Luminescent screens or photographic plates for imaging; Apparatus specially adapted therefor, e. g. cameras, TV-cameras, photographic equipment or exposure control; Optical subsystems specially adapted therefor, e. g. microscopes for observing image on luminescent screen}
H01J37/224 (Luminescent screens or photographic plates for imaging) appears on 99 US grants and 63 published applications in this corpus.
Search patents in H01J- Granted patents
- 99
- Published applications
- 63
- Assignees
- 44
- Inventors
- 203
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 4 | 0 |
| 1988 | 4 | 0 |
| 1989 | 9 | 0 |
| 1990 | 5 | 0 |
| 1991 | 5 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 1 |
| 2002 | 2 | 2 |
| 2003 | 1 | 0 |
| 2004 | 0 | 2 |
| 2005 | 0 | 0 |
| 2006 | 2 | 5 |
| 2007 | 3 | 0 |
| 2008 | 1 | 2 |
| 2009 | 3 | 2 |
| 2010 | 1 | 1 |
| 2011 | 2 | 2 |
| 2012 | 0 | 2 |
| 2013 | 2 | 2 |
| 2014 | 1 | 2 |
| 2015 | 2 | 2 |
| 2016 | 3 | 3 |
| 2017 | 3 | 1 |
| 2018 | 0 | 3 |
| 2019 | 5 | 7 |
| 2020 | 5 | 5 |
| 2021 | 5 | 1 |
| 2022 | 3 | 7 |
| 2023 | 2 | 2 |
| 2024 | 3 | 3 |
| 2025 | 1 | 5 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Sample image observation device and method6 Oct 2026US 12,755,926 B2Hitachi High-Tech Corporation
- Apparatus for analyzing and/or processing a sample with a particle beam and method24 Mar 2026US 12,586,755 B2Carl Zeiss SMT GmbH
- Apparatus and method for detecting one or more scanning charged particle beams12 Aug 2025US 12,387,905 B2Delmic IP B.V.
- Transmission electron microscope and imaging method31 Dec 2024US 12,183,542 B2Hitachi High-Tech Corporation
- Method and apparatus for Schottky TFE inspection10 Dec 2024US 12,165,834 B2NuFlare Technology America, Inc.
- Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling26 Feb 2026US 2026/0056014 A1Technische Universiteit Delft
- Light collection/injection mirror alignment25 Dec 2025US 2025/0391631 A1
- Charged particle beam device24 Jul 2025US 2025/0239430 A1Hitachi High-Tech Corporation
- Charged Particle Beam Apparatus15 May 2025US 2025/0157786 A1Hitachi, Ltd.
- Recipe Creating System, Length Measurement System, and Recipe Creating Method1 May 2025US 2025/0140516 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Electron beam inspection system and inspection method and method of manufacturing devices using the system67US 6,992,290 B2Ebara Corporation · 2006
- Transmission-type scanning charged-particle beam microscope41US 4,211,924 ASiemens Aktiengesellschaft · 1980
- Cooled CCD camera for an electron microscope39US 5,065,029 AGatan, Inc. · 1991
- Rotatable wide angle camera and prism assembly for electron microscopes32US 5,536,941 AGatan, Inc. · 1996
- Method of recording and reproducing images produced by an electron microscope21US 4,651,220 AFuji Photo Film Co., Ltd. · 1987