H01J 37/22
Optical , image processing or photographic arrangements associated with the tube
Official title: Optical {, image processing} or photographic arrangements associated with the tube
H01J37/22 (Optical , image processing or photographic arrangements associated with the tube) appears on 1,592 US grants and 1,776 published applications in this corpus.
Search patents in H01J- Granted patents
- 1,592
- Published applications
- 1,776
- Assignees
- 349
- Inventors
- 2,967
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 5 | 0 |
| 1978 | 3 | 0 |
| 1979 | 0 | 0 |
| 1980 | 4 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 4 | 0 |
| 1985 | 4 | 0 |
| 1986 | 1 | 0 |
| 1987 | 4 | 0 |
| 1988 | 4 | 0 |
| 1989 | 11 | 0 |
| 1990 | 8 | 0 |
| 1991 | 10 | 0 |
| 1992 | 5 | 0 |
| 1993 | 6 | 0 |
| 1994 | 4 | 0 |
| 1995 | 9 | 0 |
| 1996 | 5 | 0 |
| 1997 | 7 | 0 |
| 1998 | 7 | 0 |
| 1999 | 3 | 0 |
| 2000 | 3 | 0 |
| 2001 | 7 | 8 |
| 2002 | 10 | 20 |
| 2003 | 15 | 13 |
| 2004 | 10 | 20 |
| 2005 | 14 | 28 |
| 2006 | 27 | 36 |
| 2007 | 30 | 36 |
| 2008 | 31 | 44 |
| 2009 | 30 | 28 |
| 2010 | 30 | 36 |
| 2011 | 31 | 42 |
| 2012 | 40 | 53 |
| 2013 | 41 | 54 |
| 2014 | 56 | 48 |
| 2015 | 66 | 97 |
| 2016 | 82 | 93 |
| 2017 | 86 | 80 |
| 2018 | 91 | 82 |
| 2019 | 100 | 126 |
| 2020 | 120 | 133 |
| 2021 | 113 | 111 |
| 2022 | 118 | 136 |
| 2023 | 85 | 114 |
| 2024 | 66 | 119 |
| 2025 | 102 | 136 |
| 2026 | 79 | 83 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Method for electron beam-induced processing of a defect of a microlithographic photomask6 Oct 2026US 12,754,470 B2Carl Zeiss SMT GmbH
- System and method for fully integrated microcrystal electron diffraction (MicroED)6 Oct 2026US 12,755,925 B2The Regents of the University of California
- Sample image observation device and method6 Oct 2026US 12,755,926 B2Hitachi High-Tech Corporation
- Discharging a region of a sample29 Sep 2026US 12,749,648 B2Applied Materials Israel Ltd.
- Semiconductor reaction chamber29 Sep 2026US 12,749,651 B2Beijing Naura Microelectronics Equipment Co., Ltd.
- Systems and Methods for Uncertainty-Aware-Single-Particle Cryo-EM Data Collection Using Online Feedback8 Oct 2026US 2026/0311330 A1The Regents of the University of Michigan
- Method for measuring overlay using scanning electron microscope device1 Oct 2026US 2026/0301156 A1Samsung Electronics Co., Ltd.
- Image grabbing mapping method to improve system productivity in a system with multiple electron beams24 Sep 2026US 2026/0290745 A1KLA Corporation
- Method for finding optimal image contrast when using a laser phase plate17 Sep 2026US 2026/0279719 A1FEI Company
- Method for operating a particle beam device, and particle beam device17 Sep 2026US 2026/0279722 A1
Most cited
By later US patents
- Method for inspecting substrate, substrate inspecting system and electron beam apparatus113US 7,109,483 B2Ebara Corporation · 2006
- Methods and apparatus to review defects using scanning electron microscope with multiple electron beam configurations113US 8,716,662 B1KLA-Tencor Corporation · 2014
- Automatic focusing system for scanning electron microscope equipped with laser defect detection function103US 6,621,082 B2Seiko Instruments Inc. · 2003
- Visual inspection method and apparatus therefor98US 6,587,581 B1Hitachi, Ltd. · 2003
- Multilayered device micro etching method and system96US 5,055,696 AHitachi, Ltd. · 1991