H01J 37/1413
Means for interchanging parts of the lens, e. g. pole pieces within
Official title: {Means for interchanging parts of the lens, e. g. pole pieces within the tube}
H01J37/1413 (Means for interchanging parts of the lens, e. g. pole pieces within) appears on 13 US grants and 17 published applications in this corpus.
Search patents in H01J- Granted patents
- 13
- Published applications
- 17
- Assignees
- 13
- Inventors
- 44
- Latest grant
- 26 Aug 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 1 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 1 |
| 2016 | 3 | 2 |
| 2017 | 0 | 0 |
| 2018 | 0 | 2 |
| 2019 | 1 | 0 |
| 2020 | 0 | 2 |
| 2021 | 0 | 0 |
| 2022 | 1 | 3 |
| 2023 | 3 | 2 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Multi-electron beam image acquisition apparatus, multi-electron beam inspection apparatus, and multi-electron beam image acquisition method26 Aug 2025US 12,400,825 B2NuFlare Technology, Inc.
- Multipole unit and charged particle beam device26 Sep 2023US 11,769,649 B2Hitachi High-Tech Corporation
- Multistage-connected multipole, multistage multipole unit, and charged particle beam device26 Sep 2023US 11,769,650 B2Hitachi High-Tech Corporation
- Charged particle beam device2 May 2023US 11,640,897 B2Hitachi High-Technologies Corporation
- Charged particle beam apparatus30 Aug 2022US 11,430,630 B2Hitachi High-Technologies Corporation
- Charged particle lens12 Feb 2026US 2026/0045441 A1FEI Company
- Lens for a charged particle beam apparatus, charged particle beam apparatus, and method of focusing a charged particle beam27 Jun 2024US 2024/0212968 A1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Multi-electron beam image acquisition apparatus, multi-electron beam inspection apparatus, and multi-electron beam image acquisition method30 Mar 2023US 2023/0102715 A1NuFlare Technology, Inc.
- Multi-electron beam image acquisition apparatus, and multi-electron beam image acquisition method16 Mar 2023US 2023/0077403 A1NuFlare Technology, Inc.
- Multipole Unit and Charged Particle Beam Device25 Aug 2022US 2022/0270844 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Electric-magnetic field-generating element and assembling method for same5US 7,429,740 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH · 2008
- Configurable charged-particle apparatus3US 8,829,470 B2FEI Company · 2014
- Desktop electron microscope and combined round-multipole magnetic lens thereof2US 9,343,261 B2National Tsing Hua University · 2016
- Apparatus for adjusting a focal position of an electron beam and electron beam projection apparatus including the same1US 5,272,347 AFujitsu Limited · 1993
- Lens for a scanning electron microscope1US 6,906,335 B2National University of Singapore · 2005