H01J 2237/3109
Cutting
H01J2237/3109 (Cutting) appears on 18 US grants and 23 published applications in this corpus.
Search patents in H01J- Granted patents
- 18
- Published applications
- 23
- Assignees
- 17
- Inventors
- 48
- Latest grant
- 23 May 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 1 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 1 |
| 2006 | 0 | 1 |
| 2007 | 1 | 3 |
| 2008 | 1 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 2 |
| 2011 | 1 | 1 |
| 2012 | 1 | 0 |
| 2013 | 1 | 2 |
| 2014 | 1 | 0 |
| 2015 | 1 | 2 |
| 2016 | 3 | 3 |
| 2017 | 0 | 2 |
| 2018 | 2 | 1 |
| 2019 | 2 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 0 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Ion beam cutting calibration system and method23 May 2023US 11,658,001 B1Institute of Geology and Geophysics, Chinese Academy of Sciences
- Method of producing lift out specimens for teaching, practice, and training31 Dec 2019US 10,522,324 B1EXpressLO LLC
- Methods, apparatuses, systems and software for treatment of a specimen by ion-milling16 Jul 2019US 10,354,836 B2IB Labs, Inc.
- Electron beam emission device3 Jul 2018US 10,014,146 B2Korea Institute of Industrial Technology
- Systems for controlling a high power ion beam6 Feb 2018US 9,887,066 B2Neutron Therapeutics, Inc.
- Charged Particle Beam Apparatus and Sample Processing Method27 Aug 2026US 2026/0255914 A1Hitachi High-Tech Corporation
- Battery state control during cross-section beam milling18 Jun 2026US 2026/0171345 A1FEI Company
- Methods, Apparatuses, Systems and Software for Treatment of a Specimen By Ion-Milling21 Jun 2018US 2018/0174798 A1IB Labs, Inc.
- Electron beam emission device14 Sep 2017US 2017/0263411 A1Korea Institute of Industrial Technology
- Systems for controlling a high power ion beam22 Jun 2017US 2017/0178859 A1Neutron Therapeutics, Inc.
Most cited
By later US patents
- Method for sample separation and lift-out with one cut131US 6,420,722 B2Omniprobe, Inc. · 2002
- Scanning electron microscope for observation of cross section and method of observing cross section employing the same62US 5,093,572 AMitsubishi Denki Kabushiki Kaisha · 1992
- Method and apparatus for sample extraction and handling11US 8,357,913 B2FEI Company · 2013
- Method of cleaving a thin sapphire layer from a bulk material by implanting a plurality of particles and performing a controlled cleaving process10US 9,336,989 B2Silicon Genesis Corporation · 2016
- Focused ion beam apparatus and aperture4US 7,189,982 B2Hitachi High-Technologies Corporation · 2007