Ion beam cutting calibration system and method

An ion beam cutting calibration system, comprising a sample cutting table, a coarse calibration device, a microscopic observation device, and a flip table, wherein the sample cutting table comprises a sample holder and an ion beam shielding plate;

• the sample holder is configured to hold a sample;
• and the ion beam shielding plate is opposite to the sample;
• at the sample cutting table, a position and an angle of the sample relative to the ion beam shielding plate are adjustable;
• the coarse calibration device is configured to assemble the sample with the sample holder and make an end surface of the sample flush with an end surface of the sample holder;
• the microscopic observation device comprises a microscope, which is provided above the sample holder;
• a scale is provided in an eyepiece of the microscope;
• the flip table comprises a flip plate, which is connected to the sample cutting table;
• the flip plate is configured to drive the sample cutting table to swing in a vertical plane;
• and
• a swing axis of the flip plate is collinear with a side edge of a top surface of the ion beam shielding plate close to the sample.