H01J 2237/2511
Auger spectrometers
H01J2237/2511 (Auger spectrometers) appears on 22 US grants and 17 published applications in this corpus.
Search patents in H01J- Granted patents
- 22
- Published applications
- 17
- Assignees
- 18
- Inventors
- 48
- Latest grant
- 7 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 0 | 1 |
| 2006 | 0 | 1 |
| 2007 | 1 | 1 |
| 2008 | 1 | 0 |
| 2009 | 0 | 1 |
| 2010 | 1 | 1 |
| 2011 | 0 | 1 |
| 2012 | 2 | 0 |
| 2013 | 1 | 1 |
| 2014 | 1 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 1 | 3 |
| 2022 | 2 | 1 |
| 2023 | 2 | 3 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Charged particle beam apparatus7 Apr 2026US 12,597,582 B2JEOL Ltd.
- Charged particle beam device and image acquisition method30 Sep 2025US 12,431,326 B2JEOL Ltd.
- Variable reduction ratio spherical aberration correction electrostatic lens, wide angle energy analyzer, and two-dimensional electron spectrometer17 Oct 2023US 11,791,148 B2University Corporation National Nara Institute of Science and Technology
- Charged particle beam device and analysis method25 Jul 2023US 11,710,615 B2JEOL Ltd.
- Auger electron microscope and analysis method19 Jul 2022US 11,391,682 B2JEOL Ltd.
- Collision Judgment Apparatus, Recording Medium Recording Program, and Collision Judgment Method27 Jun 2024US 2024/0212975 A1JEOL Ltd.
- Electron Spectrometer and Analytical Method21 Dec 2023US 2023/0411113 A1JEOL Ltd.
- Charged Particle Beam Device and Image Acquisition Method14 Dec 2023US 2023/0402252 A1JEOL Ltd.
- Charged Particle Beam Apparatus28 Sep 2023US 2023/0307206 A1JEOL Ltd.
- Charged Particle Beam Device and Analysis Method19 May 2022US 2022/0157558 A1JEOL Ltd.
Most cited
By later US patents
- Apparatus and method for locating target area for electron microanalysis20US 5,118,941 AThe Perkin-Elmer Corporation · 1992
- Electron microscope and similar instruments17US 6,448,555 B1JEOL Ltd. · 2002
- Particle-optical apparatus involving detection of Auger electronics15US 6,455,848 B1Koninkijke Philips Electronics N.V. · 2002
- Determining layer thickness using photoelectron spectroscopy13US 7,420,163 B2ReVera Incorporated · 2008
- Scanning electron microscope with curved axes11US 7,205,542 B1KLA-Tencor Technologies Corporation · 2007