Particle-optical apparatus involving detection of Auger electronics
AssigneeKoninkijke Philips Electronics N.V.
InventorsMarcellinus Petrus Carolus Michael Krijn, Alexander Henstra
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AssigneeKoninkijke Philips Electronics N.V.
InventorsMarcellinus Petrus Carolus Michael Krijn, Alexander Henstra
Estimating the term…
In a SEM it is desirable, in given circumstances, to acquire an image of the sample (14) by means of Auger electrons extracted from the sample and traveling back through the bore of the objective lens (8) in the direction opposing the direction of the primary beam. It is known to separate extracted electrons from the primary beam by positioning Wien filters (32, 34) in front of the objective lens (8), the filters being energized in such a way that they do not cause deflection of the primary beam but do deflect the secondary electrons. This technique cannot be used for Auger electrons, considering their high energy and hence much stronger fields in the Wien filters, thus causing substantial imaging aberrations in the primary beam. According to the invention a quadrupole field is applied in the same position as the fields of each Wien filter (32, 34, 36), thus ensuring that the resolution of the image of the sample (14) is not degraded by the fields of the Wien filters.
A particle-optical apparatus which includes:
A method for separating electrically charged particles in a particle-optical apparatus according to direction of travel, in which apparatus
Dependencies are inferred from the claim text.