H01J 2237/24557
Spin polarisation
Official title: Spin polarisation (particles)
H01J2237/24557 (Spin polarisation) appears on 21 US grants and 25 published applications in this corpus.
Search patents in H01J- Granted patents
- 21
- Published applications
- 25
- Assignees
- 13
- Inventors
- 49
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 2 |
| 2009 | 0 | 0 |
| 2010 | 1 | 1 |
| 2011 | 2 | 1 |
| 2012 | 0 | 2 |
| 2013 | 2 | 1 |
| 2014 | 2 | 1 |
| 2015 | 1 | 0 |
| 2016 | 0 | 1 |
| 2017 | 1 | 2 |
| 2018 | 1 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 3 |
| 2021 | 2 | 1 |
| 2022 | 1 | 2 |
| 2023 | 1 | 1 |
| 2024 | 1 | 3 |
| 2025 | 3 | 1 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Spin-polarized scanning electron microscope8 Sep 2026US 12,731,760 B2Hitachi High-Tech Corporation
- Charged particle beam device26 Aug 2025US 12,400,827 B2Hitachi High-Tech Corporation
- Ultra-precision timing clock method18 Feb 2025US 12,226,246 B2
- Electron gun and electron microscope4 Feb 2025US 12,217,928 B2Hitachi High-Tech Corporation
- Non-contact angle measuring apparatus20 Feb 2024US 11,903,755 B2
- Electron gun and electron microscope30 Apr 2026US 2026/0120990 A1Hitachi High-Tech Corporation
- Non-invasive measuring/diagnosis/treatment apparatus and method5 Jun 2025US 2025/0176925 A1
- Spin-polarized scanning electron microscope25 Jul 2024US 2024/0249911 A1Hitachi High-Tech Corporation
- Ultra-precision timing clock method and apparatus11 Apr 2024US 2024/0115222 A1
- Electrostatic deflection convergence-type energy analyzer, imaging-type electron spectroscopic device, reflecting imaging-type electron spectroscopic device, and spin vector distribution imaging device8 Feb 2024US 2024/0047190 A1Inter-University Research Institute Corporation National Institute of Natural Sciences
Most cited
By later US patents
- Method and apparatus for detecting magnetism by means of electron spin polarization measurements through dielectronic transition8US 4,455,486 A1984
- Electron spin analyzer4US 6,639,218 B2Hokkaido University · 2003
- Transmission electron microscope4US 7,755,046 B2Hitachi, Ltd. · 2010
- System and method for producing and using multiple electron beams with quantized orbital angular momentum in an electron microscope3US 8,680,488 B22014
- Scanning electron microscope and method for analyzing secondary electron spin polarization1US 11,170,972 B2Hitachi High-Tech Corporation · 2021