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US 7,755,046 B2Granted
Transmission electron microscope
AssigneeHitachi, Ltd.
InventorsTeruo Kohashi, Takashi Ohshima, Takao Matsumoto, Hirokazu Nishida
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Abstract
Chirality distribution in the molecular structure of protein or the like and magnetic domain structure are analyzed with high resolution less than 10 nm. A transmission electron microscope equipped with a spin-polarized electron source is used for holography observation. The phase of transmission spin-polarized electrons changes due to the existence of chirality structure or magnetization in a sample, which is observed as an interference pattern phase shift in holography measurement.
Claims8
A transmission electron microscope comprising:
- a spin-polarized electron source;
- a spin rotator for rotating spin polarization of an electron beam emitted from the spin-polarized electron source;
- an optical system for irradiating a sample with the electron beam emitted from the spin-polarized electron source;
- a detector for detecting an electron that has passed through the sample;
- and
- a biprism disposed between the sample and the detector.
3 more elements
Dependencies are inferred from the claim text.