Spin-polarized scanning electron microscope

A spin-polarized scanning electron microscope comprising:

• a spin-polarized electron source configured to irradiate a sample with a spin-polarized electron beam that is an electron beam whose spin is deflected in a specific direction;
• a scanning unit configured to scan the sample by deflecting the spin-polarized electron beam;
• a spin detector configured to detect a spin direction of an emitted electron that is an electron emitted from the sample scanned with the spin-polarized electron beam;
• and
• a control unit configured to control the spin direction to be detected by the spin detector based on the spin direction of the spin-polarized electron beam, wherein
• the sample includes a virus, and
• the control unit determines a type of the virus included in the sample by comparing chirality data of the virus obtained from a signal detected by the spin detector with a database in which chirality data of various viruses is recorded.