Electron spin analyzer

An electron spin analyzer comprising;

• an electron beam-generating apparatus having an electron beam exit aperture,
• a hemisphere accelerating electrode provided opposite to electron beam exit aperture of the electron beam-generating apparatus,
• an electrode supporter to support the accelerating electrode,
• a scattered electron detector provided on an outer surface of the accelerating electrode, and
• a scattering target provided on the electrode supporter inside the accelerating electrode,
• wherein the accelerating electrode has a double structure composed of an inner accelerating electrode with an electron beam outlet to introduce scattered electrons from the scattering target into the scattered electron detector and an outer accelerating electrode with an electron beam outlet to introduce scattered electrons from the scattering target into the scattered electron detector, the electron beam outlet of the inner accelerating electrode being set larger tan the electron beam outlet of the inner accelerating electrode.

An electron spin analyzer comprising:

• an electron beam-generating apparatus having an electron beam exit aperture,
• a hemisphere accelerating electrode provided opposite to the electron beam exit aperture of the electron beam-generating apparatus,
• an electrode supporter to support the accelerating electrode,
• a scattered electron detector having a correcting electrode therein and provided on an outer surface of the accelerating electrode, and
• a scattering target provided on the electrode supporter inside the accelerating electrode.

An electron spin analyzer comprising:

• an electron beam-generating apparatus having an electron beam exit aperture,
• a hemisphere accelerating electrode provided opposite to the electron beam exit aperture of the electron beam-generating apparatus,
• an electrode supporter to support the accelerating electrode,
• a scattered electron detector provided on an outer surface of the accelerating electrode, and
• a scattering target provided on the electrode supporter inside the accelerating electrode,
• wherein the scattered electron detector is arranged in a direction shifted from an introducing direction of electrons to be detected by 100-140 degrees.

An electron spin analyzer comprising:

• an electron beam-generating apparatus having an electron beam exit aperture,
• a hemisphere accelerating electrode provided opposite to the electron beam exit aperture of the electron beam-generating apparatus,
• an electrode supporter to support the accelerating electrode,
• a scattered electron detector having a correcting electrode therein and provided on an outer surface of the accelerating electrode, and
• a scattering target provided on the electrode supporter inside the accelerating electrode,
• wherein the accelerating electrode has a double structure composed of an inner accelerating electrode having an electron beam inlet and an electron beam outlet to introduce scattered electrons from the scattering target into the scattered electron detector and an outer accelerating electrode having an electron beam inlet and an electron beam outlet to introduce scattered electrons from the scattering target into the scattered electron detector, the electron beam inlet of the inner accelerating electrode being set larger than the electron beam inlet of the outer accelerating electrode, the electron beam outlet of the inner accelerating electrode being set larger than the electron beam outlet of the outer accelerating electrode, andthe scattered electron detector is ranged in a direction shifted from an introducing direction of electrons to be introduced by 100-140 degrees.