H01J 2237/2449
Detector devices with moving charges in electric or magnetic fields
H01J2237/2449 (Detector devices with moving charges in electric or magnetic fields) appears on 152 US grants and 118 published applications in this corpus.
Search patents in H01J- Granted patents
- 152
- Published applications
- 118
- Assignees
- 69
- Inventors
- 296
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 2 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 5 | 0 |
| 1988 | 6 | 0 |
| 1989 | 9 | 0 |
| 1990 | 5 | 0 |
| 1991 | 5 | 0 |
| 1992 | 3 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 2 | 0 |
| 2001 | 0 | 1 |
| 2002 | 0 | 0 |
| 2003 | 0 | 2 |
| 2004 | 1 | 2 |
| 2005 | 4 | 3 |
| 2006 | 2 | 4 |
| 2007 | 1 | 1 |
| 2008 | 3 | 9 |
| 2009 | 3 | 4 |
| 2010 | 8 | 6 |
| 2011 | 3 | 8 |
| 2012 | 6 | 4 |
| 2013 | 10 | 5 |
| 2014 | 4 | 8 |
| 2015 | 7 | 6 |
| 2016 | 5 | 7 |
| 2017 | 6 | 10 |
| 2018 | 7 | 3 |
| 2019 | 4 | 3 |
| 2020 | 10 | 11 |
| 2021 | 11 | 5 |
| 2022 | 0 | 1 |
| 2023 | 2 | 4 |
| 2024 | 1 | 2 |
| 2025 | 3 | 3 |
| 2026 | 1 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Proximity-electrode, charged particle beam device and method for inspecting and/or imaging a sample16 Jun 2026US 12,658,401 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Electron beam system27 May 2025US 12,315,694 B2Focus-Ebeam Technology (Beijing) Co., Ltd.
- Electron microscope11 Feb 2025US 12,224,153 B2Focus-Ebeam Technology (Beijing) Co., Ltd.
- High framerate and high dynamic range electron microscopy28 Jan 2025US 12,211,667 B2Integrated Dynamic Electron Solutions, Inc.
- Charged particle beam device16 Apr 2024US 11,961,699 B2Hitachi High-Tech Corporation
- Scanning electron microscope and specimen observation method10 Sep 2026US 2026/0269169 A1Hitachi High-Tech Corporation
- Rapid mode switching of charged-particle-beam devices13 Aug 2026US 2026/0237595 A1
- Split objective lens for electron beam to enhance topographical imaging2 Jul 2026US 2026/0188603 A1
- Charged particle beam energy width reduction apparatus, method of operating thereof, and charged particle beam device11 Jun 2026US 2026/0162924 A1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Charged Particle Beam Apparatus and Control Method for Charged Particle Beam Apparatus28 May 2026US 2026/0148924 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Scanning electron microscope90US 5,872,358 AHitachi, Ltd. · 1999
- Scanning electron microscope66US 6,847,038 B2Hitachi, Ltd. · 2005
- Electron detector for use in a gaseous environment53US 4,897,545 AElectroScan Corporation · 1990
- Scanning electron microscope52US 5,900,629 AHitachi, Ltd. · 1999
- Multi-beam scanning electron beam device and methods of using the same48US 9,153,413 B2Applied Materials Israel Ltd. · 2015