H01J 2237/208
Elements or methods for movement independent of sample stage for influencing or
Official title: Elements or methods for movement independent of sample stage for influencing or moving or contacting or transferring the sample or parts thereof, e.g. prober needles or transfer needles in FIB/SEM systems
H01J2237/208 (Elements or methods for movement independent of sample stage for influencing or) appears on 129 US grants and 159 published applications in this corpus.
Search patents in H01J- Granted patents
- 129
- Published applications
- 159
- Assignees
- 53
- Inventors
- 284
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2002 | 0 | 1 |
| 2003 | 0 | 1 |
| 2004 | 1 | 4 |
| 2005 | 1 | 1 |
| 2006 | 3 | 6 |
| 2007 | 3 | 1 |
| 2008 | 4 | 3 |
| 2009 | 0 | 5 |
| 2010 | 4 | 4 |
| 2011 | 4 | 7 |
| 2012 | 6 | 4 |
| 2013 | 6 | 11 |
| 2014 | 12 | 6 |
| 2015 | 3 | 14 |
| 2016 | 10 | 7 |
| 2017 | 12 | 6 |
| 2018 | 6 | 6 |
| 2019 | 7 | 8 |
| 2020 | 12 | 10 |
| 2021 | 6 | 7 |
| 2022 | 3 | 7 |
| 2023 | 4 | 13 |
| 2024 | 6 | 12 |
| 2025 | 7 | 9 |
| 2026 | 9 | 6 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Method of sample preparation and analysis25 Aug 2026US 12,719,012 B2FEI Company
- Sample carrier for use in a charged particle microscope, and a method of using such a sample carrier in a charged particle microscope12 May 2026US 12,626,882 B2FEI Company
- Apparatus and method for manipulating a microscopic sample12 May 2026US 12,626,883 B2FEI Company
- Transfer device and analysis system24 Mar 2026US 12,586,751 B2Hitachi High-Tech Corporation
- Method for preparing a cross section with a focused ion beam24 Mar 2026US 12,588,448 B2Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e. V.
- Charged Particle Beam Device and Method for Producing and Observing Sample Piece6 Aug 2026US 2026/0229446 A1Hitachi High-Tech Corporation
- Charged Particle Beam Device30 Jul 2026US 2026/0221377 A1Hitachi High-Tech Corporation
- Conveying Method, Conveyance Device, and Analysis System30 Jul 2026US 2026/0221378 A1Hitachi High-Tech Corporation
- Measurement Method and Charged Particle Beam Device23 Jul 2026US 2026/0213124 A1Hitachi High-Tech Corporation
- Beam Apparatus, Lamella Extraction Apparatus, Lamella Observation System, and Lamella Preparation Method23 Jul 2026US 2026/0213128 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Beam as well as method and equipment for specimen fabrication56US 6,717,156 B2Hitachi, Ltd. · 2004
- Method for the manufacture and transmissive irradiation of a sample, and particle-optical system37US 6,963,068 B2FEI Company · 2005
- Planar view sample preparation37US 7,423,263 B2FEI Company · 2008
- Method for creating S/tem sample and sample structure29US 8,134,124 B2FEI Company · 2012
- Sample preparation stage29US 8,754,384 B1FEI Company · 2014