G11C 2229/726
Redundancy information loaded from the outside into the memory
G11C2229/726 (Redundancy information loaded from the outside into the memory) appears on 18 US grants and 16 published applications in this corpus.
Search patents in G11C- Granted patents
- 18
- Published applications
- 16
- Assignees
- 15
- Inventors
- 51
- Latest grant
- 25 Nov 2014
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2006 | 2 | 1 |
| 2007 | 0 | 2 |
| 2008 | 2 | 2 |
| 2009 | 2 | 6 |
| 2010 | 5 | 2 |
| 2011 | 3 | 1 |
| 2012 | 1 | 1 |
| 2013 | 1 | 0 |
| 2014 | 2 | 1 |
By publication year.
Recent patents
- Memory device and operating method of memory device and memory system25 Nov 2014US 8,897,087 B2SK hynix Inc.
- Integrated circuit having memory repair information storage and method therefor21 Jan 2014US 8,634,263 B2Freescale Semiconductor, Inc.
- Selectable repair pass masking29 Oct 2013US 8,570,820 B2International Business Machines Corporation
- Circuits and methods for processing memory redundancy data2 Oct 2012US 8,281,190 B2Avago Technologies Enterprise IP (Singapore) Pte. Ltd.
- Memory circuit6 Sep 2011US 8,015,438 B2Qimonda AG
- Memory device and operating method of memory device and memory system9 Oct 2014US 2014/0301150 A1SK hynix Inc.
- Selectable repair pass masking13 Sep 2012US 2012/0230136 A1International Business Machines Corporation
- Circuits and methods for processing memory redundancy data3 Feb 2011US 2011/0029813 A1Avago Technologies Enterprise IP (Singapore) Pte. Ltd.
- Integrated circuit having memory repair information storage and method therefor4 Nov 2010US 2010/0277990 A1Freescale Semiconductor, Inc.
- Memory compiler redundancy10 Jun 2010US 2010/0142298 A1Stellar Kinetics LLC
Most cited
By later US patents
- Method and apparatus for storing and distributing memory repair information52US 7,757,135 B2Mentor Graphics Corporation · 2010
- Memory circuit17US 8,015,438 B2Qimonda AG · 2011
- Self-diagnostic scheme for detecting errors14US 7,694,196 B2Qimonda North America Corp. · 2010
- Integrated circuit having memory repair information storage and method therefor13US 8,634,263 B2Freescale Semiconductor, Inc. · 2014
- Memory device internal parameter reliability10US 7,529,969 B1Micron Technology, Inc. · 2009