G11C 2229/00
Indexing scheme relating to checking stores for correct operation, subsequent repair or
Official title: Indexing scheme relating to checking stores for correct operation, subsequent repair or testing stores during standby or offline operation
G11C2229/00 (Indexing scheme relating to checking stores for correct operation, subsequent repair or) appears on 115 US grants and 126 published applications in this corpus.
Search patents in G11C- Granted patents
- 115
- Published applications
- 126
- Assignees
- 53
- Inventors
- 217
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 1 |
| 2006 | 3 | 8 |
| 2007 | 5 | 13 |
| 2008 | 9 | 17 |
| 2009 | 10 | 12 |
| 2010 | 11 | 5 |
| 2011 | 11 | 12 |
| 2012 | 2 | 5 |
| 2013 | 10 | 6 |
| 2014 | 9 | 10 |
| 2015 | 6 | 6 |
| 2016 | 5 | 4 |
| 2017 | 6 | 2 |
| 2018 | 1 | 4 |
| 2019 | 6 | 3 |
| 2020 | 4 | 4 |
| 2021 | 4 | 3 |
| 2022 | 3 | 4 |
| 2023 | 4 | 0 |
| 2024 | 1 | 4 |
| 2025 | 3 | 1 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Static random access memory and its layout pattern5 May 2026US 12,621,974 B2United Microelectronics Corp.
- Controller to detect malfunctioning address of memory device18 Feb 2025US 12,230,350 B2Rambus Inc.
- Memory test system and memory test method7 Jan 2025US 12,190,977 B2Nanya Technology Corporation
- Memory test system and memory test method7 Jan 2025US 12,190,978 B2Nanya Technology Corporation
- Anti-fuse devices and anti-fuse units14 May 2024US 11,985,818 B2Changxin Memory Technologies, Inc.
- Method of operating static random access memory5 Mar 2026US 2026/0068118 A1United Microelectronics Corp.
- Controller to detect malfunctioning address of memory device10 Jul 2025US 2025/0226051 A1Rambus Inc.
- Memory test system and memory test method3 Oct 2024US 2024/0331792 A1Nanya Technology Corporation
- Memory test system and memory test method3 Oct 2024US 2024/0331793 A1Nanya Technology Corporation
- Static random access memory and its layout pattern2 May 2024US 2024/0147683 A1United Microelectronics Corp.
Most cited
By later US patents
- Method and apparatus for storing and distributing memory repair information52US 7,757,135 B2Mentor Graphics Corporation · 2010
- Implementing vertical die stacking to distribute logical function over multiple dies in through-silicon-via stacked semiconductor device41US 8,516,409 B2International Business Machines Corporation · 2013
- Controller to detect malfunctioning address of memory device39US 10,446,256 B2Rambus Inc. · 2019
- Programmable memory repair scheme39US 7,768,847 B2Rambus Inc. · 2010
- Fuses for memory repair39US 7,839,707 B2Vitesse Semiconductor Corporation · 2010