Memory test system and memory test method
AssigneeNanya Technology Corporation
InventorsCheng-Ting Hsu, Yung-Huang Liao
Life of this patent
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Abstract
The present disclosure provides a memory test system, including a tester and a processor. The tester is configured to perform a final test to the memory device to obtain a test result, and read a read-only data of the packaged memory device. The processor is coupled to the tester, configured to perform a function to transform the read-only data to a chip ID of the packaged memory device when the memory device does not pass the final test according to the test result. When the packaged memory device does not pass the final test, the processor is further configured to obtain a process history of the packaged memory device according to the chip ID.
Claims11
A memory test system, comprising:
- a tester, configured to perform a final test to a packaged memory device to obtain a test result, and read a read-only data of the packaged memory device;
- and
- a processor, coupled to the tester, configured to perform a function to transform the read-only data to a chip ID of the packaged memory device when the memory device does not pass the final test according to the test result,
- wherein when the packaged memory device does not pass the final test, the processor is further configured to obtain a process history of the packaged memory device according to the chip ID.
Dependencies are inferred from the claim text.