US 8,570,820 B2 · Selectable repair pass masking

Abstract

The present invention relates to a method and circuit for selectively repairing an embedded memory module having memory elements in an integrated circuit chip. The method includes performing a plurality of tests on the embedded memory module under operating conditions to identify a plurality of non-operational memory elements in the embedded memory module and, in response to identifying the non-operational memory elements, generating a plurality of corresponding repair solutions. The method further includes storing the plurality of corresponding repair solutions in a non-volatile storage element and determining from a mask a subset of the plurality of repair solutions that should be restored.

Claims20

Dependent claims

A method for selectively repairing an embedded memory module having memory elements in an integrated circuit chip, the method comprising:

performing a plurality of tests on the embedded memory module under operating conditions to identify non-operational memory elements in the embedded memory module;
in response to identifying the non-operational memory elements, accumulating a plurality of corresponding repair solutions in a repair register while performing the plurality of tests;
storing the plurality of corresponding repair solutions, accumulated in the repair register, in a non-volatile storage element;
and
determining from a mask a subset of the plurality of corresponding repair solutions that should be restored.

2 more elements

A circuit for selectively repairing an embedded memory module having memory elements in an integrated circuit chip comprising:

a repair register adapted to accumulate a plurality of repair solutions while a plurality of tests is performed on the embedded memory module under operating conditions to identify non-operational memory elements in the embedded memory module;
a non-volatile storage element adapted to store the plurality of repair solutions, wherein the plurality of repair solutions is generated in response to identifying the non-operational memory elements;
a repair mask register adapted to store a plurality of mask bits associated with each of the plurality of repair solutions stored in the non-volatile storage element;
and
a control logic for selectively restoring a subset of the plurality of repair solutions stored in the non-volatile storage element based on the mask bits, wherein the control logic is electrically coupled to the repair register, the non-volatile storage element and the repair mask register.

2 more elements

Dependencies are inferred from the claim text.

Selectable repair pass masking

Life of this patent

Selectable repair pass masking

Life of this patent

Abstract

Claims20