G11C 16/3463
Circuits or methods to detect overprogrammed nonvolatile memory cells, usually during program
Official title: {Circuits or methods to detect overprogrammed nonvolatile memory cells, usually during program verification}
G11C16/3463 (Circuits or methods to detect overprogrammed nonvolatile memory cells, usually during program) appears on 103 US grants and 94 published applications in this corpus.
Search patents in G11C- Granted patents
- 103
- Published applications
- 94
- Assignees
- 36
- Inventors
- 113
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 2 | 0 |
| 1999 | 0 | 0 |
| 2000 | 4 | 0 |
| 2001 | 5 | 4 |
| 2002 | 2 | 4 |
| 2003 | 6 | 4 |
| 2004 | 3 | 3 |
| 2005 | 3 | 5 |
| 2006 | 2 | 2 |
| 2007 | 4 | 2 |
| 2008 | 1 | 2 |
| 2009 | 1 | 0 |
| 2010 | 4 | 5 |
| 2011 | 5 | 6 |
| 2012 | 4 | 4 |
| 2013 | 5 | 0 |
| 2014 | 5 | 3 |
| 2015 | 2 | 0 |
| 2016 | 1 | 2 |
| 2017 | 1 | 1 |
| 2018 | 2 | 5 |
| 2019 | 6 | 8 |
| 2020 | 10 | 9 |
| 2021 | 4 | 5 |
| 2022 | 5 | 6 |
| 2023 | 4 | 4 |
| 2024 | 5 | 4 |
| 2025 | 5 | 3 |
| 2026 | 2 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Flash memory and testing method thereof15 Sep 2026US 12,738,340 B2Winbond Electronics Corp.
- Non-volatile memory with adaptive dummy word line bias17 Feb 2026US 12,555,637 B2SanDisk Technologies LLC
- Systems and methods to avoid over programming at infrequent smart verify acquisition for high-performance 3D NAND2 Dec 2025US 12,488,844 B2SanDisk Technologies LLC
- Memory device, memory system, and method of operating the memory system3 Jun 2025US 12,321,611 B2Samsung Electronics Co., Ltd.
- Nonvolatile semiconductor memory device13 May 2025US 12,300,320 B2Kioxia Corporation
- Nonvolatile semiconductor memory device11 Jun 2026US 2026/0162722 A1Kioxia Corporation
- Method for operating memory device14 May 2026US 2026/0134921 A1Macronix International Co., Ltd.
- Adaptive program verify scheme with sensistive verify for defect detection1 Jan 2026US 2026/0004863 A1Micron Technology, Inc.
- Flash memory and testing method thereof12 Jun 2025US 2025/0191672 A1Winbond Electronics Corp.
- Memory device, operation method of memory device, and page buffer included in memory device27 Mar 2025US 2025/0104748 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Nonvolatile semiconductor memory device with soft-programming to adjust erased state of memory cells178US 6,134,140 AKabushiki Kaisha Toshiba · 2000
- Non-volatile semiconductor memory device153US 6,907,497 B2Kabushiki Kaisha Toshiba · 2005
- Error detection, documentation, and correction in a flash memory device125US 7,203,874 B2Micron Technology, Inc. · 2007
- Method and circuitry for performing analog over-program and under-program detection for a multistate memory cell87US 6,278,632 B1Micron Technology, Inc. · 2001
- Detecting over programmed memory81US 6,917,542 B2SanDisk Corporation · 2005