G06F 11/27
Built-in tests
G06F11/27 (Built-in tests) appears on 786 US grants and 718 published applications in this corpus.
Search patents in G06F- Granted patents
- 786
- Published applications
- 718
- Assignees
- 301
- Inventors
- 1,782
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 3 | 0 |
| 1981 | 1 | 0 |
| 1982 | 5 | 0 |
| 1983 | 0 | 0 |
| 1984 | 3 | 0 |
| 1985 | 5 | 0 |
| 1986 | 1 | 0 |
| 1987 | 7 | 0 |
| 1988 | 4 | 0 |
| 1989 | 2 | 0 |
| 1990 | 9 | 0 |
| 1991 | 5 | 0 |
| 1992 | 8 | 0 |
| 1993 | 6 | 0 |
| 1994 | 6 | 0 |
| 1995 | 7 | 0 |
| 1996 | 12 | 0 |
| 1997 | 9 | 0 |
| 1998 | 7 | 0 |
| 1999 | 10 | 0 |
| 2000 | 3 | 0 |
| 2001 | 4 | 3 |
| 2002 | 10 | 12 |
| 2003 | 14 | 9 |
| 2004 | 13 | 24 |
| 2005 | 6 | 9 |
| 2006 | 10 | 13 |
| 2007 | 16 | 17 |
| 2008 | 17 | 17 |
| 2009 | 12 | 27 |
| 2010 | 17 | 20 |
| 2011 | 25 | 19 |
| 2012 | 19 | 28 |
| 2013 | 17 | 21 |
| 2014 | 35 | 42 |
| 2015 | 40 | 45 |
| 2016 | 54 | 38 |
| 2017 | 40 | 40 |
| 2018 | 32 | 43 |
| 2019 | 41 | 39 |
| 2020 | 39 | 33 |
| 2021 | 31 | 18 |
| 2022 | 31 | 35 |
| 2023 | 39 | 49 |
| 2024 | 43 | 47 |
| 2025 | 45 | 37 |
| 2026 | 21 | 33 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Testing of security systems in integrated circuits8 Sep 2026US 12,730,898 B2NXP B. V.
- Thread data race detection and synchronization for parallel implementation of verification testbenches21 Jul 2026US 12,688,102 B1Synopsys, Inc.
- Monitor circuit to determine integrated circuit condition based on diagnostic code sequence21 Jul 2026US 12,688,349 B2QUALCOMM Incorporated
- Determination apparatus, test system, determination method, and computer-readable medium14 Jul 2026US 12,681,820 B2Advantest Corporation
- Architecture for testing multiple scan chains30 Jun 2026US 12,669,541 B2STMicroelectronics International N. V.
- Health management in a firmware framework24 Sep 2026US 2026/0288611 A1Dell Products L. P.
- Unified test and debug chiplet architecture17 Sep 2026US 2026/0276704 A1Intel Corporation
- Fault aggregation and remapping in an electronic system17 Sep 2026US 2026/0277758 A1Arteris, Inc.
- Testing System27 Aug 2026US 2026/0252068 A1Kunyi Electronics Technology (Shanghai) Co., Ltd.
- Service predictor for test and measurement instruments27 Aug 2026US 2026/0252452 A1
Most cited
By later US patents
- Built-in self test for integrated circuits189US 5,173,906 A1992
- Data processing system with self testing and configuration mapping capability168US 4,334,307 AHoneywell Information Systems Inc. · 1982
- Enhanced embedded logic analyzer158US 6,704,889 B2Altera Corporation · 2004
- Semiconductor array having built-in test circuit for wafer level testing149US 5,457,400 AMicron Technology, Inc. · 1995
- Test system for LSI circuits resident on LSI chips130US 4,357,703 AControl Data Corporation · 1982