G06F 11/26
Functional testing
G06F11/26 (Functional testing) appears on 4,743 US grants and 4,044 published applications in this corpus.
Search patents in G06F- Granted patents
- 4,743
- Published applications
- 4,044
- Assignees
- 1,283
- Inventors
- 10,113
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 9 | 0 |
| 1977 | 7 | 0 |
| 1978 | 5 | 0 |
| 1979 | 4 | 0 |
| 1980 | 18 | 0 |
| 1981 | 13 | 0 |
| 1982 | 11 | 0 |
| 1983 | 6 | 0 |
| 1984 | 16 | 0 |
| 1985 | 22 | 0 |
| 1986 | 21 | 0 |
| 1987 | 35 | 0 |
| 1988 | 30 | 0 |
| 1989 | 37 | 0 |
| 1990 | 30 | 0 |
| 1991 | 36 | 0 |
| 1992 | 31 | 0 |
| 1993 | 32 | 0 |
| 1994 | 43 | 0 |
| 1995 | 67 | 0 |
| 1996 | 86 | 0 |
| 1997 | 73 | 0 |
| 1998 | 99 | 0 |
| 1999 | 100 | 0 |
| 2000 | 72 | 0 |
| 2001 | 83 | 25 |
| 2002 | 67 | 89 |
| 2003 | 83 | 117 |
| 2004 | 93 | 132 |
| 2005 | 96 | 126 |
| 2006 | 111 | 140 |
| 2007 | 113 | 135 |
| 2008 | 109 | 147 |
| 2009 | 108 | 183 |
| 2010 | 130 | 121 |
| 2011 | 134 | 110 |
| 2012 | 117 | 142 |
| 2013 | 132 | 184 |
| 2014 | 209 | 237 |
| 2015 | 234 | 247 |
| 2016 | 268 | 206 |
| 2017 | 204 | 203 |
| 2018 | 178 | 190 |
| 2019 | 233 | 173 |
| 2020 | 195 | 177 |
| 2021 | 189 | 190 |
| 2022 | 155 | 155 |
| 2023 | 184 | 162 |
| 2024 | 172 | 175 |
| 2025 | 146 | 156 |
| 2026 | 97 | 122 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Secure debug access of a system-on-chip device6 Oct 2026US 12,754,812 B2NXP USA, Inc.
- Memory sub-system testing and validation6 Oct 2026US 12,754,813 B2Micron Technology, Inc.
- Method for injecting fault with variable power supply and apparatus therefor29 Sep 2026US 12,748,671 B2Electronics and Telecommunications Research Institute
- Management of test case champions22 Sep 2026US 12,743,355 B2International Business Machines Corporation
- Method and system for establishing data transfer processes between components of a test system22 Sep 2026US 12,743,356 B2National Instruments Corporation
- Electronic device logistics and testing system8 Oct 2026US 2026/0310563 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310564 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310565 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310566 A1Communications Test Design, Inc.
- Method of data corruption on an uart communication bus8 Oct 2026US 2026/0310568 A1Microchip Technology Incorporated
Most cited
By later US patents
- System and method for configuring an instrument to perform measurement functions utilizing conversion of graphical programs into hardware implementations336US 6,219,628 B1National Instruments Corporation · 2001
- Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, including interactive system for hierarchical display of control and dataflow information324US 5,801,958 ALSI Logic Corporation · 1998
- Emulation devices, systems and methods utilizing state machines263US 5,329,471 ATexas Instruments Incorporated · 1994
- Method of correcting a machine check error261US 6,948,094 B2Intel Corporation · 2005
- Method and system for creating, deriving and validating structural description of electronic system from higher level, behavior-oriented description, including interactive schematic design and simulation252US 5,544,067 ALSI Logic Corporation · 1996