G06F 11/263
Generation of test inputs
Official title: Generation of test inputs, e.g. test vectors, patterns or sequences {; with adaptation of the tested hardware for testability with external testers}
G06F11/263 (Generation of test inputs) appears on 1,390 US grants and 1,388 published applications in this corpus.
Search patents in G06F- Granted patents
- 1,390
- Published applications
- 1,388
- Assignees
- 523
- Inventors
- 3,226
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 4 | 0 |
| 1997 | 5 | 0 |
| 1998 | 12 | 0 |
| 1999 | 19 | 0 |
| 2000 | 13 | 0 |
| 2001 | 13 | 2 |
| 2002 | 14 | 18 |
| 2003 | 21 | 31 |
| 2004 | 19 | 23 |
| 2005 | 31 | 42 |
| 2006 | 34 | 49 |
| 2007 | 34 | 44 |
| 2008 | 32 | 39 |
| 2009 | 35 | 58 |
| 2010 | 38 | 34 |
| 2011 | 27 | 38 |
| 2012 | 36 | 35 |
| 2013 | 43 | 71 |
| 2014 | 59 | 80 |
| 2015 | 89 | 110 |
| 2016 | 108 | 102 |
| 2017 | 97 | 92 |
| 2018 | 90 | 73 |
| 2019 | 97 | 53 |
| 2020 | 76 | 62 |
| 2021 | 77 | 62 |
| 2022 | 58 | 62 |
| 2023 | 58 | 40 |
| 2024 | 55 | 54 |
| 2025 | 58 | 69 |
| 2026 | 35 | 45 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Secure debug access of a system-on-chip device6 Oct 2026US 12,754,812 B2NXP USA, Inc.
- Memory sub-system testing and validation6 Oct 2026US 12,754,813 B2Micron Technology, Inc.
- Method for injecting fault with variable power supply and apparatus therefor29 Sep 2026US 12,748,671 B2Electronics and Telecommunications Research Institute
- Management of test case champions22 Sep 2026US 12,743,355 B2International Business Machines Corporation
- Automated testing for content receivers8 Sep 2026US 12,730,731 B2DISH Technologies L. L. C.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310563 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310564 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310565 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310566 A1Communications Test Design, Inc.
- Infrastructure test execution support system and infrastructure test execution support method1 Oct 2026US 2026/0300002 A1Hitachi, Ltd.
Most cited
By later US patents
- Method and system for testing hardware and/or software applications179US 6,279,124 B1Qwest Communications International Inc. · 2001
- System and method for configuring a reconfigurable system135US 7,290,244 B2National Instruments Corporation · 2007
- Test definition tool128US 6,002,868 ACompaq Computer Corporation · 1999
- Processor based BIST for an embedded memory126US 5,961,653 AInternational Business Machines Corporation · 1999
- Method and apparatus for providing extensible object-oriented fault injection121US 6,484,276 B1Lucent Technologies Inc. · 2002