G06F 11/267
Reconfiguring circuits for testing
Official title: Reconfiguring circuits for testing, e.g. LSSD, partitioning
G06F11/267 (Reconfiguring circuits for testing) appears on 410 US grants and 328 published applications in this corpus.
Search patents in G06F- Granted patents
- 410
- Published applications
- 328
- Assignees
- 141
- Inventors
- 728
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 3 | 0 |
| 1987 | 2 | 0 |
| 1988 | 2 | 0 |
| 1989 | 4 | 0 |
| 1990 | 1 | 0 |
| 1991 | 4 | 0 |
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 4 | 0 |
| 1995 | 3 | 0 |
| 1996 | 6 | 0 |
| 1997 | 2 | 0 |
| 1998 | 4 | 0 |
| 1999 | 4 | 0 |
| 2000 | 9 | 0 |
| 2001 | 4 | 0 |
| 2002 | 2 | 3 |
| 2003 | 8 | 11 |
| 2004 | 10 | 9 |
| 2005 | 6 | 15 |
| 2006 | 7 | 14 |
| 2007 | 10 | 8 |
| 2008 | 12 | 13 |
| 2009 | 11 | 18 |
| 2010 | 12 | 18 |
| 2011 | 27 | 17 |
| 2012 | 21 | 19 |
| 2013 | 16 | 24 |
| 2014 | 31 | 23 |
| 2015 | 24 | 19 |
| 2016 | 24 | 12 |
| 2017 | 10 | 13 |
| 2018 | 14 | 14 |
| 2019 | 17 | 14 |
| 2020 | 16 | 12 |
| 2021 | 15 | 16 |
| 2022 | 11 | 6 |
| 2023 | 20 | 15 |
| 2024 | 13 | 9 |
| 2025 | 7 | 5 |
| 2026 | 5 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and system for establishing data transfer processes between components of a test system22 Sep 2026US 12,743,356 B2National Instruments Corporation
- Seamless universal verification methodology1 Sep 2026US 12,724,070 B1Amazon Technologies, Inc.
- Generating audit records for distributed computing system-based motor vehicle18 Aug 2026US 12,711,234 B2Hewlett Packard Enterprise Development LP
- Streaming scan network latency balancing to reduce cost of testing identical replicated blocks2 Jun 2026US 12,645,623 B2QUALCOMM Incorporated
- Information processing apparatus, integrated circuit, and information processing method24 Feb 2026US 12,561,505 B2FUJIFILM Business Innovation Corp.
- Segmented testing method for functional safety testing circuit, electronic device, and storage medium18 Jun 2026US 2026/0169060 A1VeriSilicon Microelectronics (Shanghai) Co., Ltd.
- Common control and/or observation for internal state tracking11 Dec 2025US 2025/0377994 A1Arm Limited
- Streaming scan network latency balancing to reduce cost of testing identical replicated blocks4 Dec 2025US 2025/0370944 A1QUALCOMM Incorporated
- Scan synchronous-write-through testing architectures for a memory device13 Nov 2025US 2025/0348394 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Automatic Host Triaging And Repair Using Structured Logging24 Jul 2025US 2025/0238338 A1Oracle International Corporation
Most cited
By later US patents
- Multi-core chip providing external core access with regular operation function interface and predetermined service operation services interface comprising core interface units and masters interface unit240US 6,115,763 AInternational Business Machines Corporation · 2000
- High-speed integrated circuit testing with JTAG125US 5,355,369 AAT&T Bell Laboratories · 1994
- Symmetric multiprocessing computer with non-uniform memory access architecture124US 5,887,146 AData General Corporation · 1999
- Bus arbitration system for multiprocessor architecture120US 6,026,461 AData General Corporation · 2000
- Processor condition sensing circuits, systems and methods110US 6,032,268 ATexas Instruments Incorporated · 2000