G03H 2260/53
Photoconductor thermoplastic reactivity wherein light is transformed into an electrostatic then into
Official title: Photoconductor thermoplastic reactivity wherein light is transformed into an electrostatic then into a thickness distribution
G03H2260/53 (Photoconductor thermoplastic reactivity wherein light is transformed into an electrostatic then into) appears on 21 US grants and 14 published applications in this corpus.
Search patents in G03H- Granted patents
- 21
- Published applications
- 14
- Assignees
- 9
- Inventors
- 30
- Latest grant
- 14 Jun 2016
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 3 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 2 | 1 |
| 2004 | 1 | 1 |
| 2005 | 1 | 2 |
| 2006 | 2 | 0 |
| 2007 | 0 | 2 |
| 2008 | 2 | 1 |
| 2009 | 0 | 1 |
| 2010 | 2 | 1 |
| 2011 | 1 | 0 |
| 2012 | 0 | 1 |
| 2013 | 1 | 1 |
| 2014 | 1 | 1 |
| 2015 | 0 | 0 |
| 2016 | 1 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devices14 Jun 2016US 9,366,719 B2Attofemto, Inc.
- Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materials27 May 2014US 8,736,823 B2Attofemto, Inc.
- Optical to optical infrared imaging detection system26 Mar 2013US 8,405,823 B2Attofemto, Inc.
- Holographic condition assessment system for a structure including a semiconductor material18 Oct 2011US 8,040,521 B2Attofemto, Inc.
- Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material10 Aug 2010US 7,773,230 B2Attofemto, Inc.
- Advanced 4-dimensional signal and device testing using circuit-state recognition6 Oct 2016US 2016/0291088 A1Attofemto, Inc.
- Optical to optical time and spatial resolution enhancements for improving characterization of secondary electron emission and control for etch-, electron-, and ion-beam devices17 Apr 2014US 2014/0103935 A1Attofemto, Inc.
- Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materials18 Jul 2013US 2013/0181722 A1Attofemto, Inc.
- Holographic condition assessment system for a structure including a semiconductor material31 May 2012US 2012/0133922 A1Attofemto, Inc.
- Holographic condition assessment system for a structure including a semiconductor material15 Apr 2010US 2010/0091292 A1Attofemto, Inc.
Most cited
By later US patents
- Optical to optical infrared imaging detection system68US 8,405,823 B2Attofemto, Inc. · 2013
- Voltage testing and measurement57US 6,803,777 B22004
- Method for testing a device under test including the interference of two beams56US 6,512,385 B12003
- Condition assessment method for a structure including a semiconductor material29US 7,728,958 B2Attofemto, Inc. · 2010
- Condition assessment system for a structure including a semiconductor material21US 7,420,687 B2Attofemto, Inc. · 2008