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US 2012/0133922 A1Published application
Holographic condition assessment system for a structure including a semiconductor material
AssigneeAttofemto, Inc.
InventorPaul L. Pfaff
Life of this patent
Estimating the term…
Abstract
An improved optical infrared and ultraviolet imaging and testing system including a primary imaging device with a target portion and a secondary imaging device for determining the presence and nature of various external (e.g. magnetic field, microwave, bioelectric or incident infrared, thermal, ultraviolet, radiation, or x-rays) or internal stresses (e.g., photo-generated carriers or photo-induced resistance) or other conditions acting upon the primary detection device which are optically enhanced for detection by the secondary detection device or devices.
Claims11
An infrared or optical image detection system comprising:
- a first infrared or optical imaging device sensitive to a light which creates a photocurrent or changes in electric field or stresses within the first imaging device including array of pixels or other associated imaging devices sensitive to the light incident upon the first imaging device;
- and
- a second infrared imaging device illuminated by light incident to the first imaging device which is reflected to the second the second imaging device which images the optical changes in phase or polarization or amplitude or birefringence within the first imaging device substrate or detection elements or pixels.
Dependencies are inferred from the claim text.