G01N 2223/3302
Object and detector fixed
Official title: object and detector fixed
G01N2223/3302 (Object and detector fixed) appears on 23 US grants and 21 published applications in this corpus.
Search patents in G01N- Granted patents
- 23
- Published applications
- 21
- Assignees
- 21
- Inventors
- 53
- Latest grant
- 16 Jul 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 1 | 1 |
| 2010 | 0 | 2 |
| 2011 | 1 | 1 |
| 2012 | 1 | 0 |
| 2013 | 1 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 0 |
| 2016 | 1 | 0 |
| 2017 | 0 | 2 |
| 2018 | 1 | 2 |
| 2019 | 3 | 1 |
| 2020 | 1 | 2 |
| 2021 | 2 | 2 |
| 2022 | 1 | 3 |
| 2023 | 5 | 2 |
| 2024 | 2 | 0 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Systems and methods for generating an inspection image of an object from radiographic imaging16 Jul 2024US 12,039,713 B2Pratt & Whitney Canada Corp.
- X-ray tomography11 Jun 2024US 12,004,885 B2Xenselab, LLC
- Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof26 Dec 2023US 11,854,763 B1Borries Pte. Ltd.
- Methods and systems for acquiring three-dimensional electron diffraction data14 Nov 2023US 11,815,476 B2FEI Company
- Care area based swath speed for throughput and sensitivity improvement3 Oct 2023US 11,776,859 B2KLA Corporation
- Method of analysing a geological sample13 Feb 2025US 2025/0052700 A1
- X-ray tomography16 Nov 2023US 2023/0363723 A1Xenselab, LLC
- Systems and methods for generating an inspection image of an object from radiographic imaging28 Sep 2023US 2023/0306576 A1Pratt & Whitney Canada Corp.
- Methods and systems for acquiring three-dimensional electron diffraction data6 Oct 2022US 2022/0317066 A1FEI Company
- Systems and methods for generating an inspection image of an object from radiographic imaging4 Aug 2022US 2022/0245788 A1Pratt & Whitney Canada Corp.
Most cited
By later US patents
- X-ray photoelectron emission spectrometry system47US 5,280,176 AThe United States of America as represented by the Secretary of Commerce · 1994
- Thermal wave microscopy using areal infrared detection22US 4,578,584 AInternational Business Machines Corporation · 1986
- X-ray inspecting apparatus and X-ray inspecting method6US 8,391,581 B2OMRON Corporation · 2013
- System and method for colorizing a radiograph from cabinet X-ray systems5US 10,937,161 B2KUB Techologles Inc. · 2021
- System and method for colorizing a radiograph from cabinet X-ray systems5US 11,162,909 B2KUB Technologies Inc. · 2021