G01N 2223/33
Scanning, i.e. relative motion for measurement of successive object-parts
Official title: scanning, i.e. relative motion for measurement of successive object-parts
G01N2223/33 (Scanning, i.e. relative motion for measurement of successive object-parts) appears on 514 US grants and 683 published applications in this corpus.
Search patents in G01N- Granted patents
- 514
- Published applications
- 683
- Assignees
- 317
- Inventors
- 1,415
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 3 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 1 |
| 2006 | 1 | 4 |
| 2007 | 4 | 3 |
| 2008 | 3 | 4 |
| 2009 | 3 | 3 |
| 2010 | 1 | 3 |
| 2011 | 5 | 8 |
| 2012 | 5 | 10 |
| 2013 | 5 | 13 |
| 2014 | 10 | 11 |
| 2015 | 19 | 18 |
| 2016 | 12 | 19 |
| 2017 | 10 | 29 |
| 2018 | 19 | 25 |
| 2019 | 35 | 60 |
| 2020 | 48 | 56 |
| 2021 | 50 | 54 |
| 2022 | 41 | 75 |
| 2023 | 63 | 66 |
| 2024 | 61 | 81 |
| 2025 | 62 | 60 |
| 2026 | 50 | 79 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 2223/3306Object rotatesIndexing code124
- G01N 2223/3307Source and detector fixedIndexing code118
- G01N 2223/3303Object fixedIndexing code114
- G01N 2223/3308Object translatesIndexing code87
- G01N 2223/3301Beam is modified for scanIndexing code68
- G01N 2223/3304Helicoidal scanIndexing code28
- G01N 2223/3302Object and detector fixedIndexing code23
- G01N 2223/3305Detector fixedIndexing code8
Recent patents
- X-ray inspection apparatus6 Oct 2026US 12,754,147 B2Ishida Co., Ltd.
- Attitude adjustment structure, conveying device, radiation imaging system6 Oct 2026US 12,754,149 B2Nuctech Company Limited
- Methods and systems for model-less, scatterometry based measurements of semiconductor structures22 Sep 2026US 12,743,027 B2KLA Corporation
- CT imaging system15 Sep 2026US 12,736,484 B2Nuctech Company Limited
- Spin-polarized scanning electron microscope8 Sep 2026US 12,731,760 B2Hitachi High-Tech Corporation
- Battery cell inspection apparatus, battery cell inspection method, and battery cell inspection system8 Oct 2026US 2026/0309647 A1SK On Co., Ltd.
- Method for scanning an object in a scanning apparatus8 Oct 2026US 2026/0309651 A1ROLLS-ROYCE plc
- Device for Contactless Measurement of the Microstructure of Moving Material Webs1 Oct 2026US 2026/0298848 A1IMS Messsysteme GmbH
- Rapid x-ray radiation imaging system and related method24 Sep 2026US 2026/0287522 A1Jst Power Equipment, Inc.
- Extended range active illumination imager24 Sep 2026US 2026/0287528 A1NexGen Semi Holding, Inc.
Most cited
By later US patents
- Cone beam CT scanning302US 8,964,934 B22015
- Cat scanner with simultaneous translation and rotation of objects105US 4,989,225 ABio-Imaging Research, Inc. · 1991
- X-ray tomography inspection systems98US 7,876,879 B2Rapiscan Systems, Inc. · 2011
- Mobile aircraft inspection system79US 8,483,356 B2Rapiscan Systems, Inc. · 2013
- X-ray tomography inspection systems74US 8,135,110 B2Rapiscan Systems, Inc. · 2012