G01N 2223/3305
Detector fixed
Official title: detector fixed; source and body moving
G01N2223/3305 (Detector fixed) appears on 8 US grants and 9 published applications in this corpus.
Search patents in G01N- Granted patents
- 8
- Published applications
- 9
- Assignees
- 10
- Inventors
- 25
- Latest grant
- 28 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2016 | 0 | 1 |
| 2017 | 0 | 0 |
| 2018 | 1 | 1 |
| 2019 | 1 | 3 |
| 2020 | 3 | 1 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 1 |
| 2025 | 0 | 1 |
| 2026 | 2 | 1 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Ray scanning apparatus28 Jul 2026US 12,693,243 B2Nuctech Company Limited
- Detection apparatus and battery production device9 Jun 2026US 12,650,392 B2Contemporary Amperex Technology Co., Limited
- Inspection device, inspection method, and method for producing object to be inspected2 May 2023US 11,639,904 B2Nikon Corporation
- X-ray diffraction apparatus4 Aug 2020US 10,732,134 B2Rigaku Corporation
- Method and apparatus for enhancing SE detection in mirror-based light imaging charged particle microscopes23 Jun 2020US 10,692,694 B2FEI Company
- X-ray imaging apparatus and device position detection method using x-ray image26 Feb 2026US 2026/0056139 A1FUJIFILM Corporation
- Detection apparatus and battery production device27 Nov 2025US 2025/0362247 A1Contemporary Amperex Technology Co., Limited
- Ray scanning apparatus25 Jul 2024US 2024/0248048 A1Nuctech Company Limited
- Inspection device, inspection method, and method for producing object to be inspected24 Sep 2020US 2020/0300784 A1Nikon Corporation
- X-ray diffraction apparatus26 Sep 2019US 2019/0293575 A1Rigaku Corporation
Most cited
By later US patents