Inspection device, inspection method, and method for producing object to be inspected
AssigneeNikon Corporation
InventorsTakeshi OHBAYASHI, Masayuki ZAIKE, Takahiro MICHIMOTO
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AssigneeNikon Corporation
InventorsTakeshi OHBAYASHI, Masayuki ZAIKE, Takahiro MICHIMOTO
Estimating the term…
An inspection device includes a ray source that irradiates an object to be inspected with energy rays, a detection unit that detects energy rays that have passed through the object to be inspected, a displacement mechanism that sets a relative position of the object to be inspected and the ray source by displacing at least one of the object to be inspected and the ray source in relation to the other, an internal image generation unit that generates an internal image of the object to be inspected based on a detection amount distribution of the energy rays detected by the detection unit, and a control unit that controls the displacement mechanism based on the detection amount distribution of the energy rays detected by the detection unit.
An inspection device comprising:
An inspection method comprising:
An inspection method comprising:
An inspection device comprising:
A inspection method comprising:
Dependencies are inferred from the claim text.