G01N 2021/95661
For leads
Official title: {for leads, e.g. position, curvature}
G01N2021/95661 (For leads) appears on 48 US grants and 47 published applications in this corpus.
Search patents in G01N- Granted patents
- 48
- Published applications
- 47
- Assignees
- 42
- Inventors
- 129
- Latest grant
- 9 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 3 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 4 |
| 2003 | 3 | 2 |
| 2004 | 1 | 5 |
| 2005 | 4 | 3 |
| 2006 | 4 | 2 |
| 2007 | 1 | 3 |
| 2008 | 0 | 5 |
| 2009 | 3 | 1 |
| 2010 | 3 | 3 |
| 2011 | 2 | 0 |
| 2012 | 2 | 1 |
| 2013 | 0 | 1 |
| 2014 | 0 | 2 |
| 2015 | 0 | 1 |
| 2016 | 1 | 2 |
| 2017 | 2 | 0 |
| 2018 | 1 | 0 |
| 2019 | 1 | 2 |
| 2020 | 0 | 3 |
| 2021 | 1 | 2 |
| 2022 | 4 | 2 |
| 2023 | 2 | 2 |
| 2024 | 3 | 0 |
| 2025 | 1 | 1 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Optical planar metrology mounting device and methods for abrasive cross-sectioning of electrical components9 Jun 2026US 12,650,294 B2The United States of America as represented by the Secretary of the Navy
- Apparatus, method and recording medium for inspecting coating state of object coated on substrate3 Jun 2025US 12,322,086 B2Koh Young Technology Inc.
- Appearance inspection device and defect inspection method19 Mar 2024US 11,936,985 B2OMRON Corporation
- Measurement machine and method for detecting a defect in solder joints12 Mar 2024US 11,927,436 B2Hewlett Packard Enterprise Development LP
- Electronic component evaluation method, electronic component evaluation device, and electronic component evaluation program30 Jan 2024US 11,887,290 B2Sumida Corporation
- Optical planar metrology mounting device and methods for abrasive cross-sectioning of electrical components3 Jul 2025US 2025/0216190 A1The United States of America as represented by the Secretary of the Navy
- Apparatus, method and recording medium for inspecting coating state of object coated on substrate16 Nov 2023US 2023/0368370 A1Koh Young Technology Inc.
- Measurement machine and method for detecting a defect in solder joints23 Feb 2023US 2023/0059410 A1Hewlett Packard Enterprise Development LP
- Appearance inspection device and defect inspection method10 Nov 2022US 2022/0360720 A1OMRON Corporation
- Loop height measurement of overlapping bond wires14 Apr 2022US 2022/0115253 A1Emage Vision Pte. Ltd.
Most cited
By later US patents
- Systems and methods for providing illumination in machine vision systems300US 6,624,597 B2Color Kinetics Incorporated · 2003
- Method and apparatus for inspection of specular, three-dimensional features125US 5,058,178 AAT&T Bell Laboratories · 1991
- Method and apparatus for inspecting solder portions47US 5,598,345 AMatsushita Electric Industrial Co., Ltd. · 1997
- System and method for measuring object features with coordinated two and three dimensional imaging35US 6,291,816 B1Robotic Vision Systems, Inc. · 2001
- Optical inspection system33US 7,075,565 B1Landrex Technologies Co., Ltd. · 2006