G01N 2021/95638
For pcb's
Official title: {for PCB's}
G01N2021/95638 (For pcb's) appears on 321 US grants and 314 published applications in this corpus.
Search patents in G01N- Granted patents
- 321
- Published applications
- 314
- Assignees
- 177
- Inventors
- 765
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 9 | 0 |
| 1988 | 7 | 0 |
| 1989 | 8 | 0 |
| 1990 | 4 | 0 |
| 1991 | 9 | 0 |
| 1992 | 11 | 0 |
| 1993 | 7 | 0 |
| 1994 | 4 | 0 |
| 1995 | 3 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 1 |
| 2002 | 2 | 9 |
| 2003 | 8 | 7 |
| 2004 | 4 | 9 |
| 2005 | 6 | 7 |
| 2006 | 10 | 6 |
| 2007 | 7 | 12 |
| 2008 | 4 | 10 |
| 2009 | 6 | 6 |
| 2010 | 8 | 14 |
| 2011 | 5 | 6 |
| 2012 | 12 | 15 |
| 2013 | 5 | 15 |
| 2014 | 5 | 15 |
| 2015 | 8 | 16 |
| 2016 | 12 | 16 |
| 2017 | 14 | 4 |
| 2018 | 13 | 16 |
| 2019 | 17 | 24 |
| 2020 | 18 | 15 |
| 2021 | 17 | 14 |
| 2022 | 15 | 24 |
| 2023 | 14 | 10 |
| 2024 | 17 | 20 |
| 2025 | 17 | 14 |
| 2026 | 9 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Self correcting oven technology11 Aug 2026US 12,703,036 B2Jabil Inc.
- Method and system for detecting a false error on a component of a board inspected by an AOI machine11 Aug 2026US 12,704,464 B2Siemens Industry Software Inc.
- Multiplexed photon emitter and camera configuration for an image acquisition device11 Aug 2026US 12,707,137 B2
- System and method for rapid inspection of printed circuit board using multiple modalities14 Jul 2026US 12,681,080 B2Battelle Memorial Institute
- Board testing apparatus and board testing method16 Jun 2026US 12,656,271 B2Ckd Corporation
- System and method for rapid inspection of printed circuit board using multiple modalities8 Oct 2026US 2026/0309776 A1Battelle Memorial Institute
- Inspection device20 Aug 2026US 2026/0243700 A1Saki Corporation
- Inspection device20 Aug 2026US 2026/0243701 A1Saki Corporation
- Flux coating state inspection device and flux coating state inspection method30 Jul 2026US 2026/0219208 A1Ckd Corporation
- Apparatus and method and recording medium for recording command for determining type of defect30 Jul 2026US 2026/0219973 A1Koh Young Technology Inc.
Most cited
By later US patents
- Systems and methods for providing illumination in machine vision systems300US 6,624,597 B2Color Kinetics Incorporated · 2003
- Method and apparatus for optical inspection of substrates183US 4,877,326 AKLA Instruments Corporation · 1989
- Emission microscopy system171US 4,755,874 AKLA Instruments Corporation · 1988
- Soldering inspection system and method therefor136US 4,677,473 AMatsushita Electric Works, Ltd. · 1987
- Method and apparatus for inspection of specular, three-dimensional features125US 5,058,178 AAT&T Bell Laboratories · 1991