G01N 21/95
Characterised by the material or shape of the object to be examined
Official title: characterised by the material or shape of the object to be examined (G01N21/89 - G01N21/91, G01N21/94 take precedence)
G01N21/95 (Characterised by the material or shape of the object to be examined) appears on 9,563 US grants and 10,148 published applications in this corpus.
Search patents in G01N- Granted patents
- 9,563
- Published applications
- 10,148
- Assignees
- 2,929
- Inventors
- 18,621
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 8 | 0 |
| 1977 | 14 | 0 |
| 1978 | 7 | 0 |
| 1979 | 11 | 0 |
| 1980 | 14 | 0 |
| 1981 | 17 | 0 |
| 1982 | 16 | 0 |
| 1983 | 13 | 0 |
| 1984 | 21 | 0 |
| 1985 | 25 | 0 |
| 1986 | 32 | 0 |
| 1987 | 51 | 0 |
| 1988 | 37 | 0 |
| 1989 | 45 | 0 |
| 1990 | 46 | 0 |
| 1991 | 57 | 0 |
| 1992 | 55 | 0 |
| 1993 | 46 | 0 |
| 1994 | 46 | 0 |
| 1995 | 62 | 0 |
| 1996 | 50 | 0 |
| 1997 | 61 | 0 |
| 1998 | 99 | 0 |
| 1999 | 78 | 0 |
| 2000 | 98 | 0 |
| 2001 | 116 | 74 |
| 2002 | 132 | 229 |
| 2003 | 228 | 234 |
| 2004 | 225 | 312 |
| 2005 | 211 | 321 |
| 2006 | 279 | 351 |
| 2007 | 278 | 361 |
| 2008 | 285 | 360 |
| 2009 | 269 | 351 |
| 2010 | 301 | 319 |
| 2011 | 265 | 301 |
| 2012 | 280 | 341 |
| 2013 | 246 | 381 |
| 2014 | 309 | 415 |
| 2015 | 348 | 452 |
| 2016 | 396 | 453 |
| 2017 | 442 | 394 |
| 2018 | 406 | 471 |
| 2019 | 484 | 509 |
| 2020 | 546 | 530 |
| 2021 | 421 | 517 |
| 2022 | 395 | 537 |
| 2023 | 411 | 507 |
| 2024 | 464 | 504 |
| 2025 | 501 | 523 |
| 2026 | 316 | 401 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 21/9501Semiconductor wafers3,864
- G01N 21/956Inspecting patterns on the surface of objects3,839
- G01N 21/954Inspecting the inner surface of hollow bodies714
- G01N 21/958Inspecting transparent materials or objects626
- G01N 21/952Inspecting the exterior surface of cylindrical bodies or wires564
- G01N 21/9515Objects of complex shape495
- G01N 21/9508Capsules323
- G01N 2021/9513Liquid crystal panelsIndexing code284
Recent patents
- Time-of-flight measurement on user with cameras and position sensor6 Oct 2026US 12,751,628 B2Omni Medsci, Inc.
- Wear management system for monitoring conveyor-based systems6 Oct 2026US 12,753,016 B1Amazon Technologies, Inc.
- Optical inspection of waterjet drilled holes6 Oct 2026US 12,754,139 B1Rtx Corporation
- Deterioration estimation system, deterioration estimation method, and recording medium6 Oct 2026US 12,754,141 B2NEC Corporation
- Composite structure detecting method and system6 Oct 2026US 12,754,142 B2Advanced ACEBIOTEK CO., LTD.
- Photodetector inspection apparatus and photodetector inspection method8 Oct 2026US 2026/0309579 A1Mitsubishi Electric Corporation
- Method for suppressing variation in light emission intensity of background in photoluminescence measurement, and evaluation method for semiconductor substrate8 Oct 2026US 2026/0309625 A1Kwansei Gakuin Educational Foundation
- Optical inspection of waterjet drilled holes8 Oct 2026US 2026/0309636 A1Rtx Corporation
- Dark field defect inspection system and inspection method thereof8 Oct 2026US 2026/0309637 A1Samsung Electronics Co., Ltd.
- Inspection system for edge and bevel inspection of semiconductor structures8 Oct 2026US 2026/0309638 A1Camtek Ltd.
Most cited
By later US patents
- Defect detection system406US 4,314,763 ARCA Corporation · 1982
- Systems and methods for providing illumination in machine vision systems300US 6,624,597 B2Color Kinetics Incorporated · 2003
- Real time optical correlation system299US 5,327,286 ATexas Instruments Incorporated · 1994
- Method for coordinating multiple fields of view in multi-camera294US 5,768,443 ACognex Corporation · 1998
- Automated defect classification system281US 5,544,256 AInternational Business Machines Corporation · 1996